FQD7P06 Fairchild Semiconductor, FQD7P06 Datasheet
FQD7P06
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FQD7P06 Summary of contents
Page 1
... D FQD7P06 / FQU7P06 Units -60 V -5.4 A -3.42 A -21 -5.4 A 2.8 mJ -7.0 V/ns 2 ...
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... ≤ -7.0A, di/dt ≤ 300A ≤ DSS, 4. Pulse Test : Pulse width ≤ 300 s, Duty cycle ≤ Essentially independent of operating temperature ©2001 Fairchild Semiconductor Corporation T = 25°C unless otherwise noted C Test Conditions -250 -250 A, Referenced to 25°C ...
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... Drain Current and Gate Voltage 600 500 C oss 400 C iss 300 200 C rss 100 Drain-Source Voltage [V] DS Figure 5. Capacitance Characteristics ©2001 Fairchild Semiconductor Corporation 1 10 150℃ 25℃ ※ Notes : 1. 250μ s Pulse Test 25℃ 10V ※ ...
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... Drain-Source Voltage [V] DS Figure 9. Maximum Safe Operating Area ©2001 Fairchild Semiconductor Corporation (Continued) 2.5 2.0 1.5 1.0 ※ Notes : 0 -250 μ 0.0 100 150 200 -100 o C] Figure 8 ...
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... Unclamped Inductive Switching Test Circuit & Waveforms -10V -10V ©2001 Fairchild Semiconductor Corporation Gate Charge Test Circuit & Waveform Same Type Same Type as DUT as DUT -10V -10V DUT DUT ...
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... Peak Diode Recovery dv/dt Test Circuit & Waveforms Driver ) ( Driver ) DUT ) ( DUT ) DUT ) ( DUT ) ©2001 Fairchild Semiconductor Corporation + + DUT DUT Driver Driver Compliment of DUT Compliment of DUT ...
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... Mechanical Dimensions ©2001 Fairchild Semiconductor Corporation D - PAK Dimensions in Millimeters Rev. A2. May 2001 ...
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... Mechanical Dimensions ©2001 Fairchild Semiconductor Corporation I - PAK Dimensions in Millimeters Rev. A2. May 2001 ...
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... TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended exhaustive list of all such trademarks. ACEx™ FAST Bottomless™ FASTr™ CoolFET™ FRFET™ CROSSVOLT™ GlobalOptoisolator™ DenseTrench™ GTO™ ...