A3P125-QNG132 MICROSEMI, A3P125-QNG132 Datasheet - Page 38

• Manufacturer Part Number: A3P125-QNG132
• Manufacturer: MICROSEMI

Specifications of A3P125-QNG132

• Lead Free Status / Rohs Status: Compliant

Automotive ProASIC3 DC and Switching Characteristics
2- 26
Table 2-31 • I/O Input Rise Time, Fall Time, and Related I/O Reliability
Input Buffer
LVTTL/LVCMOS
LVDS/B-LVDS/M-
LVDS/LVPECL
*
The maximum input rise/fall time is related to the noise induced into the input buffer trace. If the noise is
low, the rise time and fall time of input buffers can be increased beyond the maximum value. The longer
the rise/fall times, the more susceptible the input signal is to the board noise. Actel recommends signal
integrity evaluation/characterization of the system to ensure there is no excessive noise coupling into
input signals.
Input Rise/Fall Time
No requirement
No requirement
(min.)
R e visio n 1
Input Rise/Fall Time
10 ns *
10 ns *
(max.)
20 years (110°C)
10 years (100°C)
Reliability