ADC10DL065EVAL National Semiconductor, ADC10DL065EVAL Datasheet - Page 21

no-image

ADC10DL065EVAL

Manufacturer Part Number
ADC10DL065EVAL
Description
Manufacturer
National Semiconductor
Datasheet

Specifications of ADC10DL065EVAL

Lead Free Status / Rohs Status
Not Compliant
Applications Information
t
output data. The result could be an apparent reduction in
dynamic performance.
To minimize noise due to output switching, minimize the load
currents at the digital outputs. This can be done by connect-
OD
to increase, making it difficult to properly latch the ADC
FIGURE 4. Application Circuit using Transformer Drive Circuit, Parallel mode
(Continued)
21
ing buffers (74ACQ541, for example) between the ADC out-
puts and any other circuitry. Only one driven input should be
connected to each output pin. Additionally, inserting series
resistors of about 100Ω at the digital outputs, close to the
ADC pins, will isolate the outputs from trace and other circuit
capacitances and limit the output currents, which could oth-
erwise result in performance degradation. See Figure 4.
www.national.com
20148613