IDT82V2084PFG8 IDT, Integrated Device Technology Inc, IDT82V2084PFG8 Datasheet - Page 57

IC LINE INTERFC UNIT 4CH 128TQFP

IDT82V2084PFG8

Manufacturer Part Number
IDT82V2084PFG8
Description
IC LINE INTERFC UNIT 4CH 128TQFP
Manufacturer
IDT, Integrated Device Technology Inc
Type
Line Interface Units (LIUs)r
Datasheet

Specifications of IDT82V2084PFG8

Protocol
E1
Voltage - Supply
3.13 V ~ 3.47 V
Mounting Type
Surface Mount
Package / Case
128-TQFP, 128-VQFP
Screening Level
Industrial
Mounting
Surface Mount
Package Type
TQFP
Operating Temperature (min)
-40C
Operating Temperature (max)
85C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of Drivers/receivers
-
Lead Free Status / RoHS Status
Compliant, Lead free / RoHS Compliant
Other names
800-1864-2
82V2084PFG8

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
IDT82V2084PFG8
Manufacturer:
IDT, Integrated Device Technology Inc
Quantity:
10 000
QUAD CHANNEL T1/E1/J1 LONG HAUL/SHORT HAUL LINE INTERFACE UNIT
Table-58 TAP Controller State Description (Continued)
Update-IR
Pause-IR
Exit2-IR
STATE
The pause state allows the test controller to temporarily halt the shifting of data through the instruction register. The test data register
This is a temporary state. While in this state, if TMS is held high, a rising edge applied to TCK causes the controller to enter the Update-IR
The instruction shifted into the instruction register is latched into the parallel output from the shift-register path on the falling edge of TCK.
selected by the current instruction retains its previous value and the instruction does not change during this state. The controller remains in
this state as long as TMS is low. When TMS goes high and a rising edge is applied to TCK, the controller moves to the Exit2-IR state.
state, which terminates the scanning process. If TMS is held low and a rising edge is applied to TCK, the controller enters the Shift-IR state.
The test data register selected by the current instruction retains its previous value and the instruction does not change during this state.
When the new instruction has been latched, it becomes the current instruction. The test data registers selected by the current instruction
retain their previous value.
1
0
Test-logic Reset
Run Test/Idle
0
Figure-22 JTAG State Diagram
1
1
0
Capture-DR
Update-DR
Pause-DR
Select-DR
Exit1-DR
Exit2-DR
Shift-DR
1
57
1
0
1
0
0
1
0
DESCRIPTION
1
1
0
0
0
1
Capture-IR
Update-IR
Select-IR
Pause-IR
Exit1-IR
Exit2-IR
Shift-IR
1
1
0
0
0
1
1
0
1
0
1
0
TEMPERATURE RANGES
INDUSTRIAL

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