IDT82V3355TF IDT, Integrated Device Technology Inc, IDT82V3355TF Datasheet - Page 80
IDT82V3355TF
Manufacturer Part Number
IDT82V3355TF
Description
Manufacturer
IDT, Integrated Device Technology Inc
Datasheet
1.IDT82V3355TF.pdf
(135 pages)
Specifications of IDT82V3355TF
Function
Wan PLL
Operating Temperature (max)
85C
Operating Temperature (min)
-40C
Package Type
TQFP
Pin Count
64
Mounting
Surface Mount
Lead Free Status / Rohs Status
Not Compliant
Available stocks
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Manufacturer
Quantity
Price
Company:
Part Number:
IDT82V3355TFG
Manufacturer:
IDT, Integrated Device Technology Inc
Quantity:
10 000
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Part Number:
IDT82V3355TFG8
Manufacturer:
IDT, Integrated Device Technology Inc
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DECAY_RATE_3_CNFG - Decay Rate for Leaky Bucket Configuration 3
IN_FREQ_READ_CH_CNFG - Input Clock Frequency Read Channel Selection
Programming Information
IDT82V3355
Address: 40H
Type: Read / Write
Default Value: XXXXXX01
Address: 41H
Type: Read / Write
Default Value: XXXX0000
7 - 2
1 - 0
Bit
7 - 4
3 - 0
Bit
7
-
7
-
DECAY_RATE_3_DATA[1:0]
IN_FREQ_READ_CH[3:0]
Name
Name
6
-
-
-
6
-
Reserved.
These bits select an input clock, the frequency of which with respect to the reference clock can be read.
0000: Reserved. (default)
0001, 0010: Reserved.
0011: IN1_CMOS.
0100: IN2_CMOS.
0101: IN1_DIFF.
0110: IN2_DIFF.
0111, 1000: Reserved.
1001: IN3_CMOS.
1010 ~ 1111: Reserved.
Reserved.
These bits set a decay rate for the internal leaky bucket accumulator:
00: The accumulator decreases by 1 in every 128 ms with no event detected.
01: The accumulator decreases by 1 in every 256 ms with no event detected. (default)
10: The accumulator decreases by 1 in every 512 ms with no event detected.
11: The accumulator decreases by 1 in every 1024 ms with no event detected.
5
-
5
-
4
-
4
-
IN_FREQ_READ
80
_CH3
3
3
-
Description
Description
IN_FREQ_READ
_CH2
2
2
-
SYNCHRONOUS ETHERNET WAN PLL
IN_FREQ_READ
DECAY_RATE_
_CH1
3_DATA1
1
1
IN_FREQ_READ
DECAY_RATE_
3_DATA0
May 19, 2009
_CH0
0
0
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