FDC654P Fairchild Semiconductor, FDC654P Datasheet

MOSFET P-CH 30V 3.6A SSOT-6

FDC654P

Manufacturer Part Number
FDC654P
Description
MOSFET P-CH 30V 3.6A SSOT-6
Manufacturer
Fairchild Semiconductor
Series
PowerTrench®r
Datasheet

Specifications of FDC654P

Fet Type
MOSFET P-Channel, Metal Oxide
Fet Feature
Logic Level Gate
Rds On (max) @ Id, Vgs
75 mOhm @ 3.6A, 10V
Drain To Source Voltage (vdss)
30V
Current - Continuous Drain (id) @ 25° C
3.6A
Vgs(th) (max) @ Id
3V @ 250µA
Gate Charge (qg) @ Vgs
9nC @ 10V
Input Capacitance (ciss) @ Vds
298pF @ 15V
Power - Max
800mW
Mounting Type
Surface Mount
Package / Case
6-SSOT, SuperSOT-6
Configuration
Single Quad Drain
Transistor Polarity
P-Channel
Resistance Drain-source Rds (on)
0.075 Ohm @ 10 V
Forward Transconductance Gfs (max / Min)
6 S
Drain-source Breakdown Voltage
30 V
Gate-source Breakdown Voltage
+/- 20 V
Continuous Drain Current
3.6 A
Power Dissipation
1600 mW
Maximum Operating Temperature
+ 150 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 55 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
FDC654P

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
FDC654P
Manufacturer:
FAIRCHILD
Quantity:
4 670
Part Number:
FDC654P
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Company:
Part Number:
FDC654P
Quantity:
6 790
Company:
Part Number:
FDC654P
Quantity:
1 320
Part Number:
FDC654P NL
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Part Number:
FDC654P-NL
Manufacturer:
FAIRCHILD
Quantity:
2 000
Part Number:
FDC654P-NL
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Part Number:
FDC654P_NL
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
This is an update of the final PCN #20043505-B to include devices with "_NL" suffix (lead-free
products) in the Affected FSID Section. Devices with no suffix and devices with "_NL" suffix
are identical products which uses Pb-free lead finish.
This is to inform you that a design and/or process change will be made to the following
product(s). This notification is for your information and concurrence.
If you require data or samples to qualify this change, please contact Fairchild Semiconductor
within 30 days of receipt of this notification.
Updated process quality documentation, such as FMEAs and Control Plans, are available for
viewing upon request.
If you have any questions concerning this change, please contact:
PCN Originator:
Name: Oyao, Sheila Marie
E-mail: Sheila.Marie.Oyao@fairchildsemi.com
Phone: (63 32) 3400534 loc 384
Implementation of change:
Expected 1st Device Shipment Date: 2007/11/24
Earliest Year/Work Week of Changed Product: 07/47
Change Type Description: Bond Wire Material Composition
Description of Change (From): Bonding wire material is Gold (Au)
Description of Change (To): Bonding wire material is Copper (Cu).
Reason for Change : Change to Cu wire to help reduce resistance and improve thermal
performance.
Qual/REL Plan Numbers : Q20070335
Qualification :
Based on the results gathered, copper bonding is a qualified process in SSOT-6lds
package.
Results/Discussion
Test: (Autoclave)
Lot
Q20070335AAACLV
Q20070335ABACLV
Q20070335BAACLV
Q20070335BBACLV
Q20070335CAACLV
DESIGN/PROCESS CHANGE NOTIFICATION -- FINAL
Technical Contact:
Name: Rivero, Douglas
E-mail: Doug.Rivero@fairchildsemi.com
Phone: 1-408-822-2143
Device
FDC640P
FDC640P
FDC655AN
FDC655AN
FDC654P
96-HOURS
0/77
0/77
0/77
0/77
0/77
Date Issued On : 2007/09/27
Date Created : 2007/08/15
Failure Code
PCN# : Q3073302
Pg. 1

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FDC654P Summary of contents

Page 1

... Based on the results gathered, copper bonding is a qualified process in SSOT-6lds package. Results/Discussion Test: (Autoclave) Lot Device Q20070335AAACLV FDC640P Q20070335ABACLV FDC640P Q20070335BAACLV FDC655AN Q20070335BBACLV FDC655AN Q20070335CAACLV FDC654P Date Created : 2007/08/15 Date Issued On : 2007/09/27 PCN# : Q3073302 96-HOURS Failure Code 0/77 0/77 0/77 0/77 0/77 Pg. 1 ...

Page 2

... FDC640P Q20070335BATMCL1 FDC655AN Q20070335BATMCL1 FDC655AN Q20070335BBTMCL1 FDC655AN Q20070335BBTMCL1 FDC655AN Q20070335CATMCL1 FDC654P Q20070335CATMCL1 FDC654P Q20070335CBTMCL1 FDC654P Q20070335CBTMCL1 FDC654P Test: 130C (Highly Accelerated Stress Test) Lot Device Q20070335AAHAST1 FDC640P Q20070335ABHAST1 FDC640P Q20070335BAHAST1 FDC655AN Q20070335BBHAST1 FDC655AN Q20070335CAHAST1 FDC654P Q20070335CBHAST1 FDC654P Test: MSL(1), PKG(Small), PeakTemp(260c), Cycles(3) (Precondition) ...

Page 3

... SuperSOT6 package at Cebu, Philippines factory. The products affected by this change are listed in the "Affected FSIDs" Section. Affected FSIDs : FDC2512_NL FDC3612_NL FDC602P_NL FDC633N_NL FDC638P_NL FDC645N_NL FDC655AN_NL NDC632P_NL SI3457DV_NL FDC2612_NL FDC5612_NL FDC604P_NL FDC634P_NL FDC640P_NL FDC653N_NL FDC658P_NL NDC651N_NL FDC3512_NL FDC5614P_NL FDC606P_NL FDC637AN_NL FDC642P_NL FDC654P_NL NDC631N_NL NDC652P_NL Pg. 3 ...

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