FDD4685 Fairchild Semiconductor, FDD4685 Datasheet - Page 2

MOSFET P-CH 40V 8.4A DPAK

FDD4685

Manufacturer Part Number
FDD4685
Description
MOSFET P-CH 40V 8.4A DPAK
Manufacturer
Fairchild Semiconductor
Series
PowerTrench®r
Datasheet

Specifications of FDD4685

Fet Type
MOSFET P-Channel, Metal Oxide
Fet Feature
Logic Level Gate
Rds On (max) @ Id, Vgs
27 mOhm @ 8.4A, 10V
Drain To Source Voltage (vdss)
40V
Current - Continuous Drain (id) @ 25° C
8.4A
Vgs(th) (max) @ Id
3V @ 250µA
Gate Charge (qg) @ Vgs
27nC @ 5V
Input Capacitance (ciss) @ Vds
2380pF @ 20V
Power - Max
3W
Mounting Type
Surface Mount
Package / Case
DPak, TO-252 (2 leads+tab), SC-63
Configuration
Single
Transistor Polarity
P-Channel
Resistance Drain-source Rds (on)
0.027 Ohm @ 10 V
Drain-source Breakdown Voltage
40 V
Gate-source Breakdown Voltage
+/- 20 V
Continuous Drain Current
8.4 A
Power Dissipation
69000 mW
Maximum Operating Temperature
+ 150 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 55 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
FDD4685TR

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Manufacturer:
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FDD4685 Rev.B
Electrical Characteristics
Off Characteristics
On Characteristics
Dynamic Characteristics
Switching Characteristics
Drain-Source Diode Characteristics
Notes:
1: R
2: Pulse Test: Pulse Width < 300µs, Duty cycle < 2.0%.
3: Starting T
BV
∆BV
I
I
V
r
g
C
C
C
R
t
t
t
t
Q
Q
Q
V
t
Q
∆V
DSS
GSS
d(on)
r
d(off)
f
rr
DS(on)
FS
GS(th)
SD
iss
oss
rss
g
∆T
∆T
g(TOT)
gs
gd
rr
R
Symbol
a. 40°C/W when mounted on a 1 in
b. 96°C/W when mounted on a minimum pad.
DSS
θJA
θJC
GS(th)
DSS
J
J
is the sum of the junction-to-case and case-to- ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins.
is guaranteed by design while R
J
= 25°C, L = 3mH, I
Drain to Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
Gate to Source Leakage Current
Gate to Source Threshold Voltage
Gate to Source Threshold Voltage
Temperature Coefficient
Static Drain to Source On Resistance
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Gate Charge
Gate to Source Gate Charge
Gate to Drain “Miller” Charge
Source to Drain Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
AS
(Note 2)
= 9A, V
2
Parameter
θJA
pad of 2 oz copper
DD
is determined by the user’s board design.
= 40V, V
T
GS
J
= 10V.
= 25°C unless otherwise noted
V
V
V
V
V
f = 1MHz
f = 1MHz
V
I
V
V
V
V
V
I
I
I
V
V
D
F
D
D
DD
GS
DD
GS
GS
GS
GS
GS
DS
DS
GS
DS
GS
= –8.4A, di/dt = 100A/µs
= –250µA, referenced to 25°C
= –250µA, V
= –250µA, referenced to 25°C
= –5V
= –20V, V
= –20V, I
= –10V, R
=–20V, I
= –10V, I
= –5V, I
= 0V, I
= –32V, V
= V
= –10V, I
= –4.5V, I
= ±20V, V
2
DS
Test Conditions
, I
S
D
D
= –8.4A
D
D
D
D
D
GS
GEN
= –8.4A
GS
= –8.4A
= –250µA
GS
= –8.4A, T
= –8.4A
= –8.4A
GS
= –7A
= 0V,
= 0V
= 0V
= 6Ω
= 0V
(Note 2)
J
=125°C
Min
–40
–1
–0.85
1790
–1.6
260
140
5.6
6.1
Typ
4.9
30
31
–33
15
34
14
19
23
30
33
23
4
8
2380
–1.2
±100
Max
345
205
16
27
55
26
27
45
47
–3
27
35
42
–1
www.fairchildsemi.com
mV/°C
mV/°C
Units
mΩ
nC
pF
pF
pF
nC
nC
nC
µA
nA
ns
ns
ns
ns
ns
V
V
S
V

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