4432-T-B1 B 470 Silicon Laboratories Inc, 4432-T-B1 B 470 Datasheet - Page 31
4432-T-B1 B 470
Manufacturer Part Number
4432-T-B1 B 470
Description
RF Modules & Development Tools Tx/Rx Split 4432 TRx Testcard
Manufacturer
Silicon Laboratories Inc
Datasheet
1.4432-T-B1_B_470.pdf
(74 pages)
Specifications of 4432-T-B1 B 470
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
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3.5.7. TX Data Rate Generator
The data rate is configurable between 0.123–256 kbps. For data rates below 30 kbps the ”txdtrtscale” bit in register
70h should be set to 1. When higher data rates are used this bit should be set to 0.
The TX date rate is determined by the following formula in bps:
For data rates higher than 100 kbps, Register 58h should be changed from its default of 80h to C0h. Non-optimal
modulation and increased eye closure will result if this setting is not made for data rates higher than 100 kbps. The
txdr register is only applicable to TX mode and does not need to be programmed for RX mode. The RX bandwidth
which is partly determined from the data rate is programmed separately.
Add R/W Function/Description
6E
6F
R/W
R/W
TX Data Rate 1
TX Data Rate 0
txdr[15:0]
txdr[15] txdr[14] txdr[13] txdr[12] txdr[11]
txdr[7]
D7
DR_TX (bps)
=
txdr[6]
D6
DR_TX(bps) 2
-------------------------------------------------------------------------------------
=
Rev 1.1
txdr[5]
txdr 15:0
-------------------------------------------------- -
D5
2
16
1 MHz
+
5
16
txdr[4]
txdtrtscale
1 MHz
D4
+
5
txdtrtscale
txdr[3]
D3
Si4430/31/32-B1
txdr[10]
txdr[2]
D2
txdr[9]
txdr[1]
D1
txdr[8]
txdr[0]
D0
POR Def.
0Ah
3Dh
31
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