4432-T-B1 B 470 Silicon Laboratories Inc, 4432-T-B1 B 470 Datasheet - Page 11

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4432-T-B1 B 470

Manufacturer Part Number
4432-T-B1 B 470
Description
RF Modules & Development Tools Tx/Rx Split 4432 TRx Testcard
Manufacturer
Silicon Laboratories Inc
Datasheet

Specifications of 4432-T-B1 B 470

Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Table 5. Auxiliary Block Specifications
Temperature Sensor
Accuracy
Temperature Sensor
Sensitivity
Low Battery Detector
Resolution
Low Battery Detector
Conversion Time
Microcontroller Clock
Output Frequency
General Purpose ADC
Resolution
General Purpose ADC Bit
Resolution
Temp Sensor & General
Purpose ADC Conversion
Time
30 MHz XTAL Start-Up time
30 MHz XTAL Cap
Resolution
32 kHz XTAL Start-Up Time
32 kHz Accuracy using
Internal RC Oscillator
32 kHz RC Oscillator Start-
Up
POR Reset Time
Software Reset Time
Notes:
1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are
2. Guaranteed by qualification. Qualification test conditions are listed in the "Production Test Conditions" section on
2
listed in the "Production Test Conditions" section on page 14.
page 14.
Parameter
2
2
2
2
2
2
2
2
2
2
32KRC
ADC
ADC
Symbol
LBD
30M
ADC
LBD
t
32kRC
t
TS
TS
F
t
t
t
POR
30M
32k
soft
MC
RES
RES
ENB
RES
A
S
CT
CT
RES
After calibrated via sensor offset
Using XTAL and board layout in
reference design. Start-up time
See "5.8. Crystal Oscillator" on
will vary with XTAL type and
1
15 MHz, 10 MHz, 4 MHz,
3 MHz, 2 MHz, 1 MHz, or
Configurable to 30 MHz,
capacitance calculation
page 40 for total load
register tvoffs[7:0]
board layout.
Conditions
32.768 kHz
Rev 1.1
Si4430/31/32-B1
32.768K
Min
1000
Typ
250
305
600
500
250
0.5
50
97
16
5
8
4
6
Max
30M
mV/°C
mV/bit
Units
ppm
mV
sec
Hz
ms
°C
µs
bit
µs
µs
µs
µs
fF
11

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