FOD3184 Fairchild Semiconductor, FOD3184 Datasheet
FOD3184
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FOD3184 Summary of contents
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... High performance uninterruptible power supply ■ Isolated Power MOSFET/IGBT gate drive Description The FOD3184 Output Current, High Speed MOSFET/IGBT Gate Drive Optocoupler. It consists of a aluminium gallium arsenide (AlGaAs) light emitting diode optically coupled to a CMOS detector with PMOS and NMOS output power transistors integrated circuit power stage ...
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... Anode 3 Cathode ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0.4 V – V “Negative Going” (Turn-off 30V 0V to 10V 10V to 12V 12V to 30V Description Not Connected LED Anode LED Cathode Not Connected Negative Supply Voltage Output Voltage 2 (internally connected to V Output Voltage 1 Positive Supply Voltage ...
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... Safety Limit Values – Maximum Values Allowed in the Event of a Failure T Case Temperature Case I Input Current S,INPUT P Output Power S,OUTPUT R Insulation Resistance ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0.4 Parameter , 100% Production Test with PR , Type and Sample Test with , V = 500V Min. Typ. Max. Unit I–IV I– ...
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... Symbol Parameter V – V Power Supply Input Current (ON) F(ON) V Input Voltage (OFF) F(OFF) ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0 25°C unless otherwise specified) A (1) (2) (2) (3) (3) 4 Value Units -40 to +125 °C -40 to +100 ° ...
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... Input Forward Voltage F ∆ Temperature Coefficient of Forward F A Voltage V UVLO Threshold UVLO+ V UVLO– UVLO UVLO Hysteresis HYST BV Input Reverse Breakdown Voltage R C Input Capacitance IN ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0.4 = 30V Test Conditions – V – 1V – V – 6V – 1V) OL ...
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... Immunity *Typical values 25°C A Isolation Characteristics Symbol Parameter V Withstand Isolation Voltage ISO R Resistance (input to output) I-O C Capacitance (input to output) I-O *Typical values 25°C A ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0.4 = 30V Test Conditions Min. ( 10mA 10Ω, ( 250kHz, (7) Duty Cycle = 50 10nF 10nF, ...
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... Fairchild Semiconductor Corporation FOD3184 Rev. 1.0.4 propagation delay is measured from the 50% level on the rising edge of the input PLH signal for any given device. PLH and t between any two FOD3184 parts under same operating conditions, with PLH O < 1.0V). O < 10µA). I-O 7 will approach V ...
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... Duty Cycle = 99.9% V (off 15V to 30V 0.5 1.0 I – OUTPUT HIGH CURRENT (A) OH ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0.4 Fig. 2 Output High Voltage Drop vs. Ambient Temperature 0.00 Frequency = 200Hz Duty Cycle = 0.1% -0. 10mA to 16mA 15V to 30V -0. -40°C A -0. 25° ...
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... Ambient Temperature 3 15V to 30V 3.4 Output = Open 3.2 3.0 2.8 2.6 2.4 2.2 -40 - – AMBIENT TEMPERATURE (°C) A ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0.4 (Continued) Fig. 8 Output Low Current vs. Ambient Temperature 100 -40 3.6 3.2 2.8 I (15V) DDH 2.4 I (15V) DDL 2.0 ...
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... Fig. 17 Transfer Characteristics 30V 25° 0.5 1.0 I – FORWARD LED CURRENT (mA) F ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0.4 (Continued) Fig. 14 Propagation Delay vs. Ambient Temperature 450 350 250 t PHL t PLH 150 -40 Fig. 16 Propagation Delay vs. Series Load Capacitance 450 350 250 150 50 ...
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... Typical Performance Curves ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0.4 (Continued) Fig. 19 Under Voltage Lockout (13.00V (11.40V – – SUPPLY VOLTAGE ( www.fairchildsemi.com ...
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... -3.0V to 0.8V F(OFF) Pulse Generator PW = 10µs Period = 5ms Pulse- 50Ω OUT LED-IFmon Test Conditions: Frequency = 200Hz Duty Cycle = 0. 15V to 30V 10mA to 16mA F ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0 100Ω 100Ω Figure 20. I Test Circuit 100Ω ...
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... Test Circuit (Continued 16mA F ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0 0.1µ Figure 22. V Test Circuit 0.1µ Figure 23. V Test Circuit 30V DD – 100mA 100mA + 30V DD – www.fairchildsemi.com ...
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... Test Circuit (Continued 16mA -3.0 to 0.8V – F ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0 0.1µ Figure 24. I Test Circuit DDH 0.1µ Figure 25. I Test Circuit DDL 30V DD – 30V DD – www.fairchildsemi.com ...
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... Test Circuit (Continued –3.0 to 0.8V – 10mA F ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0 0.1µ Figure 26. I Test Circuit FLH 0.1µ Figure 27. V Test Circuit FHL 0.1µ Figure 28. UVLO Test Circuit 30V DD – V > 30V DD – 15V or 30V – ...
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... Test Circuit (Continued) + – Probe F = 250kHz DC = 50% 50Ω OUT Figure 29 – ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0 PLH PHL , and t Test Circuit and Waveforms PHL PLH – 2,000V CM ∆t Switch 10mA F Switch 0mA F Figure 30. CMR Test Circuit and Waveforms 16 0.1µF ...
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... Fairchild products. Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings: http://www.fairchildsemi.com/packaging/ ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0.4 0.4" Lead Spacing (Option T) 9.40–9.91 6.35–6.86 3.68–3.94 5 ...
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... Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products. Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings: http://www.fairchildsemi.com/packaging/ ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0.4 (2.54) (1.78) (1.54) (9.96) (13 ...
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... SMT 8-Pin (Lead Bend), DIN EN/IEC 60747-5-2 option FOD3184TV DIP 8-Pin, 0.4” Lead Spacing, DIN EN/IEC 60747-5-2 option FOD3184TSV SMT 8-Pin, 0.4” Lead Spacing, DIN EN/IEC 60747-5-2 option FOD3184TSR2V SMT 8-Pin, 0.4” Lead Spacing, DIN EN/IEC 60747-5-2 option Marking Information Definitions 1 2 ...
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... ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0 User Direction of Feed Description Tape Width Tape Thickness Sprocket Hole Pitch Sprocket Hole Diameter Sprocket Hole Location Pocket Location Pocket Pitch Pocket Dimensions Cover Tape Width Cover Tape Thickness Max. Component Rotation or Tilt Min. Bending Radius ...
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... ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0 User Direction of Feed Description Tape Width Tape Thickness Sprocket Hole Pitch Sprocket Hole Diameter Sprocket Hole Location Pocket Location Pocket Pitch Pocket Dimensions Cover Tape Width Cover Tape Thickness Max. Component Rotation or Tilt Min. Bending Radius ...
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... Time (t ) Maintained Above (T L Peak Body Package Temperature Time (t ) within 5°C of 260°C P Ramp-down Rate (T Time 25°C to Peak Temperature ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0.4 Max. Ramp-up Rate = 3°C/S Max. Ramp-down Rate = 6°C/S Tsmax Preheat Area Tsmin t s 120 240 Time 25° ...
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... Datasheet Identification Product Status Advance Information Formative / In Design Preliminary First Production No Identification Needed Full Production Obsolete Not In Production ©2005 Fairchild Semiconductor Corporation FOD3184 Rev. 1.0.4 PRELIMINARY INFORMATION ® PowerTrench PowerXS™ SM Programmable Active Droop™ ® QFET QS™ Quiet Series™ ...