ATMEGA128A-AU Atmel, ATMEGA128A-AU Datasheet - Page 258

MCU 8BIT 128K ISP FLASH 64-TQFP

ATMEGA128A-AU

Manufacturer Part Number
ATMEGA128A-AU
Description
MCU 8BIT 128K ISP FLASH 64-TQFP
Manufacturer
Atmel
Series
AVR® ATmegar
Datasheets

Specifications of ATMEGA128A-AU

Core Processor
AVR
Core Size
8-Bit
Speed
16MHz
Connectivity
EBI/EMI, I²C, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, POR, PWM, WDT
Number Of I /o
53
Program Memory Size
128KB (64K x 16)
Program Memory Type
FLASH
Eeprom Size
4K x 8
Ram Size
4K x 8
Voltage - Supply (vcc/vdd)
2.7 V ~ 5.5 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-TQFP, 64-VQFP
Processor Series
ATMEGA128x
Core
AVR8
Data Bus Width
8 bit
Data Ram Size
4 KB
Interface Type
JTAG
Maximum Clock Frequency
16 MHz
Number Of Programmable I/os
53
Number Of Timers
4
Operating Supply Voltage
2.7 V to 5.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
3rd Party Development Tools
EWAVR, EWAVR-BL
Development Tools By Supplier
ATAVRDRAGON, ATSTK500, ATSTK600, ATAVRISP2, ATAVRONEKIT
Minimum Operating Temperature
- 40 C
On-chip Adc
10 bit, 8 Channel
On-chip Dac
10 bit, 8 Channel
Cpu Family
ATmega
Device Core
AVR
Device Core Size
8b
Frequency (max)
16MHz
Total Internal Ram Size
4KB
# I/os (max)
53
Number Of Timers - General Purpose
4
Operating Supply Voltage (typ)
3.3/5V
Operating Supply Voltage (max)
5.5V
Operating Supply Voltage (min)
2.7V
Instruction Set Architecture
RISC
Operating Temp Range
-40C to 85C
Operating Temperature Classification
Industrial
Mounting
Surface Mount
Pin Count
64
Package Type
TQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
Q4784435

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24.12 Boundary-scan Specific JTAG Instructions
24.12.1
24.12.2
24.12.3
24.12.4
8151H–AVR–02/11
EXTEST; $0
IDCODE; $1
SAMPLE_PRELOAD; $2
AVR_RESET; $C
The Instruction Register is 4-bit wide, supporting up to 16 instructions. Listed below are the
JTAG instructions useful for Boundary-scan operation. Note that the optional HIGHZ instruction
is not implemented, but all outputs with tri-state capability can be set in high-impedant state by
using the AVR_RESET instruction, since the initial state for all port pins is tri-state.
As a definition in this data sheet, the LSB is shifted in and out first for all Shift Registers.
The OPCODE for each instruction is shown behind the instruction name in hex format. The text
describes which data register is selected as path between TDI and TDO for each instruction.
Mandatory JTAG instruction for selecting the Boundary-scan Chain as Data Register for testing
circuitry external to the AVR package. For port-pins, Pull-up Disable, Output Control, Output
Data, and Input Data are all accessible in the scan chain. For Analog circuits having off-chip
connections, the interface between the analog and the digital logic is in the scan chain. The con-
tents of the latched outputs of the Boundary-scan chain is driven out as soon as the JTAG IR-
register is loaded with the EXTEST instruction.
The active states are:
Optional JTAG instruction selecting the 32-bit ID Register as Data Register. The ID Register
consists of a version number, a device number and the manufacturer code chosen by JEDEC.
This is the default instruction after power-up.
The active states are:
Mandatory JTAG instruction for pre-loading the output latches and taking a snap-shot of the
input/output pins without affecting the system operation. However, the output latched are not
connected to the pins. The Boundary-scan Chain is selected as Data Register.
The active states are:
The AVR specific public JTAG instruction for forcing the AVR device into the Reset mode or
releasing the JTAG Reset source. The TAP controller is not reset by this instruction. The one bit
Reset Register is selected as Data Register. Note that the Reset will be active as long as there
is a logic 'one' in the Reset Chain. The output from this chain is not latched.
• Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.
• Shift-DR: The Internal Scan Chain is shifted by the TCK input.
• Update-DR: Data from the scan chain is applied to output pins.
• Capture-DR: Data in the IDCODE Register is sampled into the Boundary-scan Chain.
• Shift-DR: The IDCODE scan chain is shifted by the TCK input.
• Capture-DR: Data on the external pins are sampled into the Boundary-scan Chain.
• Shift-DR: The Boundary-scan Chain is shifted by the TCK input.
• Update-DR: Data from the Boundary-scan Chain is applied to the output latches. However,
the output latches are not connected to the pins.
ATmega128A
258

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