AT32UC3B0128-A2UR Atmel, AT32UC3B0128-A2UR Datasheet - Page 613
![MCU AVR32 128K FLASH 64-TQFP](/photos/6/81/68127/313-64-vqfp_sml.jpg)
AT32UC3B0128-A2UR
Manufacturer Part Number
AT32UC3B0128-A2UR
Description
MCU AVR32 128K FLASH 64-TQFP
Manufacturer
Atmel
Series
AVR®32 UC3r
Datasheet
1.AT32UC3B164-AUR.pdf
(680 pages)
Specifications of AT32UC3B0128-A2UR
Package / Case
64-TQFP, 64-VQFP
Voltage - Supply (vcc/vdd)
1.65 V ~ 1.95 V
Operating Temperature
-40°C ~ 85°C
Speed
60MHz
Number Of I /o
44
Core Processor
AVR
Program Memory Type
FLASH
Ram Size
32K x 8
Program Memory Size
128KB (128K x 8)
Data Converters
A/D 8x10b
Oscillator Type
Internal
Peripherals
Brown-out Detect/Reset, DMA, POR, PWM, WDT
Connectivity
I²C, IrDA, SPI, SSC, UART/USART, USB
Core Size
32-Bit
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
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27.5.3.6
27.5.3.7
32059J–12/2010
CANCEL_ACCESS
SYNC
Table 27-21. MEMORY_BLOCK_ACCESS Details (Continued)
The overhead using block word access is 4 cycles per 32 bits of data, resulting in an 88% trans-
fer efficiency, or 2.1 MBytes per second with a 20 MHz TCK frequency.
If a very slow memory location is accessed during a SAB memory access, it could take a very
long time until the busy bit is cleared, and the SAB becomes ready for the next operation. The
CANCEL_ACCESS instruction provides a possibility to abort an ongoing transfer and report a
timeout to the JTAG master.
When the CANCEL_ACCESS instruction is selected, the current access will be terminated as
soon as possible. There are no guarantees about how long this will take, as the hardware may
not always be able to cancel the access immediately. The SAB is ready to respond to a new
command when the busy bit clears.
Starting in Run-Test/Idle, CANCEL_ACCESS is accessed in the following way:
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
Table 27-22. CANCEL_ACCESS Details
This instruction allows external debuggers and testers to measure the ratio between the external
JTAG clock and the internal system clock. The SYNC data register is a 16-bit counter that
counts down to zero using the internal system clock. The busy bit stays high until the counter
reaches zero.
Starting in Run-Test/Idle, SYNC instruction is used in the following way:
1. Select the IR Scan path.
2. In Capture-IR: The IR output value is latched into the shift register.
3. In Shift-IR: The instruction register is shifted by the TCK input.
4. Return to Run-Test/Idle.
5. Select the DR Scan path.
Instructions
DR input value (Data write phase)
DR output value (Data read phase)
DR output value (Data write phase)
Instructions
IR input value
IR output value
DR Size
DR input value
DR output value
Details
dddddddd dddddddd dddddddd dddddddd xx
eb dddddddd dddddddd dddddddd dddddddd
xx xxxxxxxx xxxxxxxx xxxxxxxx xxxxxxeb
Details
10011 (0x13)
peb01
1
x
0
AT32UC3B
613
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