EVAL-ADUC847QS Analog Devices Inc, EVAL-ADUC847QS Datasheet - Page 10

• Manufacturer Part Number: EVAL-ADUC847QS
• Description: KIT DEV FOR ADUC847 QUICK START
• Manufacturer: Analog Devices Inc

Specifications of EVAL-ADUC847QS

• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

ADuC845/ADuC847/ADuC848
ABOSOLUTE MAXIMUM RATINGS
T
Table 2.
Parameter
AV
AV
DV
DV
AGND to DGND
AV
Analog Input Voltage to AGND
Reference Input Voltage to AGND
AIN/REFIN Current (Indefinite)
Digital Input Voltage to DGND
Digital Output Voltage to DGND
Operating Temperature Range
Storage Temperature Range
Junction Temperature
θ
θ
Lead Temperature, Soldering
________________________
1
2
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
AGND and DGND are shorted internally on the ADuC845, ADuC847, and ADuC848.
Applies to the P1.0 to P1.7 pins operating in analog or digital input modes.
JA
JA
A
Vapor Phase (60 sec)
Infrared (15 sec)
DD
DD
DD
DD
DD
= 25°C, unless otherwise noted.
Thermal Impedance (MQFP)
Thermal Impedance (LFCSP)
to AGND
to DGND
to DV
to DGND
to DGND
DD
1
2
Rating
–0.3 V to +7 V
–0.3 V to +7 V
–0.3 V to +7 V
–0.3 V to +7 V
–0.3 V to +0.3 V
–2 V to +5 V
–0.3 V to AV
–0.3 V to AV
30 mA
–0.3 V to DV
–0.3 V to DV
–40°C to +125°C
–65°C to +150°C
150°C
90°C/W
52°C/W
215°C
220°C
DD
DD
DD
DD
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
Rev. B | Page 10 of 108
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.