EVAL-AD5142ADBZ Analog Devices, EVAL-AD5142ADBZ Datasheet - Page 11

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EVAL-AD5142ADBZ

Manufacturer Part Number
EVAL-AD5142ADBZ
Description
Digital Potentiometer Development Tools EVALUATION BOARD I.C.
Manufacturer
Analog Devices
Series
AD5142Ar
Datasheet

Specifications of EVAL-AD5142ADBZ

Rohs
yes
Product
Evaluation Boards
Tool Is For Evaluation Of
AD5142A
Resistance
10 kOhms/100 kOhms
Operating Supply Voltage
5.5 V
Interface Type
I2C
Maximum Operating Temperature
+ 125 C
Factory Pack Quantity
1
Data Sheet
ABSOLUTE MAXIMUM RATINGS
T
Table 5.
Parameter
V
V
V
V
V
I
Digital Inputs
Operating Temperature Range, T
Maximum Junction Temperature,
Storage Temperature Range
Reflow Soldering
Package Power Dissipation
ESD
FICDM
1
2
3
4
A
Maximum terminal current is bounded by the maximum current handling of
the switches, maximum power dissipation of the package, and maximum
applied voltage across any two of the A, B, and W terminals at a given
resistance.
d = pulse duty factor.
Includes programming of EEPROM memory.
Human body model (HBM) classification.
DD
SS
DD
LOGIC
A
, I
A
, V
Pulsed
T
Peak Temperature
Time at Peak Temperature
W
= 25°C, unless otherwise noted.
to GND
J
to GND
to V
4
, I
W
Maximum
Frequency > 10 kHz
Frequency ≤ 10 kHz
to GND
, V
B
R
R
R
R
SS
B
AW
AW
AW
AW
1
to GND
= 10 kΩ
= 100 kΩ
= 10 kΩ
= 100 kΩ
A
3
Rating
−0.3 V to +7.0 V
+0.3 V to −7.0 V
7 V
−0.3 V to V
+7.0 V (whichever is less)
V
+7.0 V (whichever is less)
±6 mA/d
±1.5 mA/d
±6 mA/√d
±1.5 mA/√d
−0.3 V to V
+7 V (whichever is less)
−40°C to +125°C
150°C
−65°C to +150°C
260°C
20 sec to 40 sec
(T
4 kV
1.5 kV
SS
J
max − T
− 0.3 V, V
2
2
DD
2
LOGIC
A
)/θ
2
DD
+ 0.3 V or
+ 0.3 V
JA
+ 0.3 V or
Rev. A | Page 11 of 32
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
θ
dependent on the test board and test environment.
Table 6. Thermal Resistance
Package Type
16-Lead LFCSP
16-Lead TSSOP
1
ESD CAUTION
JEDEC 2S2P test board, still air (0 m/sec airflow).
JA
is defined by the JEDEC JESD51 standard, and the value is
θ
89.5
150.4
JA
AD5122A/AD5142A
1
1
θ
3
27.6
JC
Unit
°C/W
°C/W

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