SSTV16859MTD Fairchild Semiconductor, SSTV16859MTD Datasheet
SSTV16859MTD
Specifications of SSTV16859MTD
Related parts for SSTV16859MTD
SSTV16859MTD Summary of contents
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... This notification is for your information and concurrence. This is a preliminary notification. A Final PCN will be issued when qualification is complete and data is available. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. If you have any questions concerning this change, please contact: ...
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Change From Change To Qualification Stress Test and Sample Size Detail Device #1 FAN1655MTFX Package: NMTF0 #Leads: 016 Precondition Description: Stress P/C Standard PCNL1A JESD22-A113 Environment Stress Detail: Stress P/C Standard DOPL JESD22-A108 125C, 0V HAST2 X JESD22-A110 85%RH, 110C, ...
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... AEC-Q100-006 155C, 400V GATE- AEC-Q100-006 155C, -400V HTSL X JESD22-A103 150C SOPL1 X JESD22-A108 150C, 0V THBT X JESD22-A101 85%RH, 85C, 0V 168 TMCL1 X JESD22-A104 -65C, 150C Device #4 SSTV16859MTDX Package: NMTD0 #Leads: 064 Precondition Description: Stress P/C Standard PCNL3A JESD22-A113 Environment Stress Detail: Stress P/C Standard ...