LFE2-6E-5TN144CES Lattice Semiconductor, LFE2-6E-5TN144CES Datasheet - Page 100

• Manufacturer Part Number: LFE2-6E-5TN144CES
• Description: Semiconductors and Actives, programmable, Programmable Logic (FPGAs, PALs, CPLDs ...), gate
• Manufacturer: Lattice Semiconductor

Lattice Semiconductor
Switching Test Conditions
Figure 3-23 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 3-18.
Figure 3-23. Output Test Load, LVTTL and LVCMOS Standards
Table 3-18. Test Fixture Required Components, Non-Terminated Interfaces
LVTTL and other LVCMOS settings (L -> H, H -> L)
LVCMOS 2.5 I/O (Z -> H)
LVCMOS 2.5 I/O (Z -> L)
LVCMOS 2.5 I/O (H -> Z)
LVCMOS 2.5 I/O (L -> Z)
Note: Output test conditions for all other interfaces are determined by the respective standards.
Test Condition
*CL Includes Test Fixture and Probe Capacitance
DUT
V
R1
R2
T
1MΩ
100
R
∞
∞
∞
1
3-49
1MΩ
100
R
∞
∞
∞
CL*
2
Test Poi nt
0pF
C
DC and Switching Characteristics
LatticeECP2/M Family Data Sheet
L
LVCMOS 3.3 = 1.5V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
LVCMOS 1.5 = V
LVCMOS 1.2 = V
V
V
V
V
OH
OL
CCIO
CCIO
+ 0.10
- 0.10
/2
/2
Timing Ref.
CCIO
CCIO
CCIO
CCIO
/2
/2
/2
/2
V
V
CCIO
CCIO
V
—
—
—
—
—
—
—
T