M36L0R8060B1ZAQE STMICROELECTRONICS [STMicroelectronics], M36L0R8060B1ZAQE Datasheet - Page 12
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M36L0R8060B1ZAQE
Manufacturer Part Number
M36L0R8060B1ZAQE
Description
256 Mbit (Multiple Bank, Multi-Level, Burst) Flash Memory and 64 Mbit (Burst) PSRAM, 1.8V Supply, Multi-Chip Package
Manufacturer
STMICROELECTRONICS [STMicroelectronics]
Datasheet
1.M36L0R8060B1ZAQE.pdf
(18 pages)
M36L0R8060T1, M36L0R8060B1
DC AND AC PARAMETERS
This section summarizes the operating measure-
ment conditions, and the DC and AC characteris-
tics of the device. The parameters in the DC and
AC characteristics Tables that follow, are derived
from tests performed under the Measurement
Table 4. Operating and AC Measurement Conditions
Figure 5. AC Measurement I/O Waveform
Table 5. Device Capacitance
Note: Sampled only, not 100% tested.
12/18
V
V
V
V
V
environment)
Ambient Operating Temperature
Load Capacitance (C
Output Circuit Resistors (R
Input Rise and Fall Times
Input Pulse Voltages
Input and Output Timing Ref. Voltages
DDF
CCP
DDQF
V DDQF
PPF
PPF
Symbol
C
Supply Voltage
0V
Supply Voltage
Supply Voltage (Factory environment)
Supply Voltage (Application
C
OUT
Supply Voltage
IN
Parameter
Input Capacitance
Output Capacitance
L
)
Parameter
1
, R
2
)
V DDQF /2
AI06161b
Test Condition
–0.4
Min
–25
1.7
1.7
8.5
V
–
V
Flash Memory
OUT
IN
0 to
V
= 0V
DDQF
= 0V
Conditions summarized in
AC Measurement
check that the operating conditions in their circuit
match the operating conditions when relying on
the quoted parameters.
16.7
Figure 6. AC Measurement Load Circuit
V
30
0.1µF
DDQF
V
V
/2
DDQF
DDF
Max
1.95
1.95
9.5
85
–
5
0.1µF
+0.4
V
DDQF
C
L
Min
includes JIG capacitance
Conditions. Designers should
DEVICE
UNDER
Min
TEST
–25
1.7
–
–
–
–
0 to
V
PSRAM
Table 4., Operating and
DDQF
16.7
V
30
Max
14
18
DDQF
V
DDQF
/2
C
Max
1.95
R
85
L
–
–
–
–
1
Unit
pF
pF
R
AI08364c
2
Unit
k
pF
°C
ns
V
V
V
V
V
V
V