CY14E256L CYPRESS [Cypress Semiconductor], CY14E256L Datasheet - Page 7

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CY14E256L

Manufacturer Part Number
CY14E256L
Description
256-Kbit (32K x 8) nvSRAM
Manufacturer
CYPRESS [Cypress Semiconductor]
Datasheet

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Document #: 001-06968 Rev. *C
AC Test Loads
AC Test Conditions
Input Pulse Levels .................................................. 0 V to 3 V
Input Rise and Fall Times (10% - 90%)........................ <5 ns
Input and Output Timing Reference Levels ................... 1.5 V
Thermal Resistance
Parameter
Θ
Θ
JC
JA
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
Description
[3]
OUTPUT
Test conditions follow standard test methods and procedures
for measuring thermal impedance, per EIA / JESD51.
5.0V
PRELIMINARY
30 pF
Test Conditions
R1 480Ω
255Ω
R2
32-SOIC
TBD
TBD
CY14E256L
Page 7 of 16
°C/W
°C/W
Unit
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