bt8375kpf Conexant Systems, Inc., bt8375kpf Datasheet - Page 116

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bt8375kpf

Manufacturer Part Number
bt8375kpf
Description
Single Chip Transceivers For T1/e1 And Integrated Service Digital Network Isdn Primary Rate Interfaces Systems
Manufacturer
Conexant Systems, Inc.
Datasheet

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2.0 Circuit Description
2.12 Joint Test Access Group
2.12.1 Instructions
2-88
2.12 Joint Test Access Group
The Bt8370/8375/8376 incorporates printed circuit board testability circuits in
compliance with IEEE Std. P1149.1a–1993, IEEE Standard Test Access Port and
Boundary–Scan Architecture, commonly known as JTAG (Joint Test Action
Group).
TAP provides a standard interface through which instructions and test data are
communicated (see
(BSDL) file for the Bt8370/8375/8376 is available from the factory upon request.
internal power on reset circuit resets the JTAG port.
Figure 2-49. JTAG Diagram
In addition to the required BYPASS, SAMPLE/PRELOAD, and EXTEST
instructions, IDCODE instruction is supported. There are also two private
instructions.
Table 2-25. JTAG Instructions
The JTAG includes a Test Access Port (TAP) and several data registers. The
The test access port consists of the TDI, TCK, TMS, and TDO pins. An
Table 2-25
SAMPLE/PRELOAD
Instruction
BYPASS
EXTEST
IDCODE
Private
Private
Conexant
Figure
lists the JTAG instructions, and their codes.
TMS
TDO
TCK
TDI
2-49). A Boundary Scan Description Language
Fully Integrated T1/E1 Framer and Line Interface
JTAG Port
111 111
000 001
000 000
000 010
xxx xxx
xxx xxx
Bt8370/8375/8376
Code
N8370DSE

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