m28f008 Intel Corporation, m28f008 Datasheet - Page 18

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m28f008

Manufacturer Part Number
m28f008
Description
8 Mbit 1 Mbit X 8 Flash Memory
Manufacturer
Intel Corporation
Datasheet
M28F008
AC INPUT OUTPUT REFERENCE WAVEFORM
AC CHARACTERISTICS Read-Only Operations
NOTES
1 See AC Input Output Reference Waveform for timing measurements
2 OE may be delayed up to t
3 Sampled not 100% tested
4 See AC Input Output Reference Waveforms and AC Testing Load Circuits for testing characteristics
18
AC test inputs are driven at V
‘‘0’’ Input timing begins at V
V
t
t
t
t
t
t
t
t
t
AVAV
AVQV
ELQV
PHQV
GLQV
ELQX
EHQZ
GLQX
GHQZ
IL
Input rise and fall times (10% to 90%)
Symbol
t
t
t
t
t
t
t
t
t
t
RC
ACC
CE
PWH
OE
LZ
HZ
OLZ
DF
OH
Read Cycle Time
Address to Output Display
CE to Output Delay
RP High to Output Delay
OE to Output Delay
CE to Output Low Z
CE High to Output High Z
OE to Output Low Z
OE High to Output High Z
Output Hold from
Addresses CE or OE
Change Whichever is First
IH
OH
(2 0 V
CE
(2 4 V
– t
Parameter
TTL
OE
TTL
) and V
) for a Logic ‘‘1’’ and V
after the falling edge of CE without impact on t
k
10 ns
IL
(0 8 V
TTL
) Output timing ends at V
OL
Notes
(0 45 V
2
2
3
3
3
3
3
TTL
271232 – 9
) for a Logic
M28F008-10
Min
100
(1 4)
IH
0
0
0
and
Max
100
100
400
60
55
30
CE
AC TESTING LOAD CIRCUIT
(4)
C
C
R
L
L
L
Capacitance
e
Includes Jig
e
100 pF
3 3 kX
M28F008-12
Min
120
0
0
0
Max
120
120
400
60
55
30
(4)
271232 – 10
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns

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