zl30410 Zarlink Semiconductor, zl30410 Datasheet - Page 16

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zl30410

Manufacturer Part Number
zl30410
Description
Multi-service Line Card Pll
Manufacturer
Zarlink Semiconductor
Datasheet

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3.5
The ZL30410 JTAG (Joint Test Action Group) interface conforms to the Boundary-Scan standard IEEE1149.1-1990,
which specifies a design-for-testability technique called Boundary-Scan Test (BST). The BST architecture is made
up of four basic elements, Test Access Port (TAP), TAP Controller, Instruction Register (IR) and Test Data Registers
(TDR) and all these elements are implemented on the ZL30410.
Zarlink Semiconductor provides a Boundary Scan Description Language (BSDL) file that contains all the
information required for a JTAG test system to access the ZL30410's boundary scan circuitry. The file is available
for download from the Zarlink Semiconductor web site: www.zarlink.com.
4.0
The ZL30410 has a built-in simple control interface that makes it suitable for application that can provide only a
limited amount of supervision. This allows for building multi-service line cards without extensive programming. The
complete set of control and status pins is shown in Figure 6 - Control Interface on page 16.
4.1
The ZL30410 has five dedicated control pins for selecting modes of operation and activating different functions.
These pins are listed below:
MS2 and MS1 pins: Mode Select: The MS2 (pin 19) and MS1 (pin 18) inputs select the PLL mode of operation.
See Table 1 for details. The logic level at these inputs is sampled by the rising edge of the F8o frame pulse.
JTAG Interface
Control Pins
MS2
Control Interface
0
0
1
1
MS1
0
1
0
1
Normal mode
Holdover mode
Free-run
Reserved
RefAlign
Input Pins
RefSel
Table 1 - Operating Modes and States
MS2
MS1
FCS
Figure 6 - Control Interface
Zarlink Semiconductor Inc.
ZL30410
C
O
N
T
R
O
L
16
Mode of Operation
S
T
A
T
U
S
Output Pins
LOCK
PRIOR
HOLDOVER
SECOR
Data Sheet

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