uja1076tw/5v0/wd NXP Semiconductors, uja1076tw/5v0/wd Datasheet - Page 26

• Manufacturer Part Number: uja1076tw/5v0/wd
• Description: High-speed Can Core System Basis Chip
• Manufacturer: NXP Semiconductors

NXP Semiconductors
Table 8.
In accordance with the Absolute Maximum Rating System (IEC 60134).
[1]
[2]
[3]
[4]
[5]
[6]
[7]
[8]
[9]
UJA1076_1
Product data sheet
Symbol
T
amb
A reverse diode connected between V1 (anode) and BAT (cathode) limits the voltage drop voltage from V1(+) to BAT (-).
Verified by an external test house to ensure pins can withstand ISO 7637 part 2 automotive transient test pulses 1, 2a, 3a and 3b.
IEC 61000-4-2 (150 pF, 330 Ω).
ESD performance according to IEC 61000-4-2 (150 pF, 330 Ω) has been verified by an external test house for pins BAT, CANH, CANL,
WAKE1 and WAKE2. The result is equal to or better than ±6 kV.
Human Body Model (HBM): according to AEC-Q100-002 (100 pF, 1.5 kΩ).
V1, V2 and BAT connected to GND, emulating application circuit.
Machine Model (MM): according to AEC-Q100-003 (200 pF, 0.75 μH, 10 Ω).
Charged Device Model (CDM): according to AEC-Q100-011 (field Induced charge; 4 pF).
In accordance with IEC 60747-1. An alternative definition of virtual junction temperature is: T
fixed value to be used for the calculation of T
temperature (T
Limiting values
Parameter
ambient
temperature
amb
).
…continued
Conditions
vj
. The rating for T
Rev. 01 — 1 December 2009
vj
limits the allowable combinations of power dissipation (P) and ambient
High-speed CAN core system basis chip
vj
= T
amb
Min
−40
+ P × R
th(vj-a)
UJA1076
© NXP B.V. 2009. All rights reserved.
Max
+125
, where R
th(vj-a)
26 of 45
Unit
°C
is a