MT18VDDT6472PHG-265 Micron, MT18VDDT6472PHG-265 Datasheet - Page 22

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MT18VDDT6472PHG-265

Manufacturer Part Number
MT18VDDT6472PHG-265
Description
512MB DDR SDRAM SODIMM
Manufacturer
Micron
Datasheet
pdf: 09005aef808ffe58, source: 09005aef808ffdc7
DD9C16_32_64_128x72PHG.fm - Rev. B 9/04 EN
41. Random addressing changing and 50 percent of
42. Random addressing changing and 100 percent of
43. CKE must be active (high) during the entire time a
44. I
data changing at every transfer.
data changing at every transfer.
refresh command is executed. That is, from the
time the AUTO REFRESH command is registered,
CKE must be active at each rising clock edge, until
t
driven to a valid high or low logic level. I
similar to I
address and control inputs to remain stable.
REF later.
DD
2N specifies the DQ, DQS, and DM to be
DD
2F except I
DD
2Q specifies the
128MB, 256MB, 512MB, 1GB (x72, ECC, PLL, SR)
DD
2Q is
22
45. Whenever the operating frequency is altered, not
46. Leakage number reflects the worst case leakage
47. When an input signal is HIGH or LOW, it is
48. The -335 speed grade will operate with
200-PIN DDR SDRAM SODIMM
Although I
I
including jitter, the DLL is required to be reset.
This is followed by 200 clock cycles.
possible through the module pin, not what each
memory device contributes.
defined as a steady state logic HIGH or LOW.
= 40ns and
frequency.
DD
Micron Technology, Inc., reserves the right to change products or specifications without notice.
2F is “worst case.”
DD
t
RAS (MAX) = 120,000ns at any slower
2F, I
DD
2N, and I
©2004 Micron Technology, Inc. All rights reserved.
DD
2Q are similar,
ADVANCE
t
RAS (MIN)

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