HY27UH088GDM Hynix Semiconductor, HY27UH088GDM Datasheet - Page 21

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HY27UH088GDM

Manufacturer Part Number
HY27UH088GDM
Description
8G-Bit NAND Flash Memory
Manufacturer
Hynix Semiconductor
Datasheet
Rev 0.5 / Oct. 2005
Input / Output Capacitance
Input Capacitance
Program Time
Dummy Busy Time for Cache Program
Dummy Busy Time for Cache Read
Dummy Busy Time for the Lock or Lock-tight Block
Number of partial Program Cycles in the same page
Block Erase Time
Item
Table 11: Program / Erase / Read Characteristics
Table 10: Pin Capacitance (TA=25℃, F=1.0MHz)
Parameter
Symbol
C
C
I/O
IN
Spare Array
Main Array
Test Condition
V
V
IN
IL
=0V
=0V
Symbol
8Gbit (1Gx8bit) NAND Flash
t
HY27UH088G(2/D)M Series
t
t
t
t
NOP
NOP
PROG
CBSY
RBSY
BERS
LBSY
Min
Min
-
-
-
-
-
-
-
-
-
Typ
200
3
5
5
2
-
-
Max
40
40
Preliminary
Max
700
700
10
4
4
3
-
Unit
Cycles
Cycles
pF
pF
Unit
ms
us
us
us
us
21

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