FSA2267L10X-NL Fairchild Semiconductor, FSA2267L10X-NL Datasheet - Page 4

• Manufacturer Part Number: FSA2267L10X-NL
• Description: IC ANALOG SW DUAL SPDT 3.6V 10MICROPAK W T/R
• Manufacturer: Fairchild Semiconductor

FSA2267 / FSA2267A Rev. 1.0.1
© 2005 Fairchild Semiconductor Corporation
ESD Protection
ESD Performance of the FSA2267/FSA2267A
FSA2267
■
■
FSA267A
■
■
Human Body Model
Figure 1 shows the schematic representation of the
Human Body Model ESD event. Figure 2 is the ideal
waveform representation of the Human Body Model. The
device is tested to JEDEC: JESD22-A114 Human Body
Model.
Charged Device Model
In manufacturing test and handling environments, a
more useful model is the Charged Device Model and the
FSA2267/FSA2267A has a very good ESD immunity to
this model. The device is tested to JEDEC: JESD-C101
Charged Device Model.
IEC 61000-4-2
The IEC 61000-4-2 standard covers ESD testing and
performance of finished equipment and evaluates the
equipment in its entirety for ESD immunity. Fairchild
Semiconductor has evaluated this device using the
IEC 6100-4-2 representative system model depicted in
Figure 3.
ESD values measured via the IEC 61000-4-2 evaluation
method are influenced by the specific board layout,
board size, and many other factors of the manufacturer’s
product application. Measured system ESD values can-
not be guaranteed by Fairchild Semiconductor to exactly
correlate to a manufacturer’s in-house testing due to
these application environment variables. Fairchild Semi-
conductor has been able to determine that, for ultra-por-
table applications, an enhanced ESD immunity, relative
to the IEC 61000-4-2 specification, can be achieved with
the inclusion of a 100Ω−series resistor in the V
path to the analog switch (see Figure 4). Typical
improvements of between 3-6kV of ESD immunity (I/O to
GND) have been measured with the inclusion of the
resistor with the IEC 61000-4-2 representative model.
For more information on ESD testing methodologies,
please refer to:
AN-6019 Fairchild Analog Switch Products ESD Test
Methodology Overview
http://www.fairchildsemi.com/an/AN/AN-6019.pdf.
Additional ESD Test Conditions
For information regarding test methodologies and perfor-
mance levels, please contact Fairchild Semiconductor.
HBM all pins 7.0kV
CDM all pins 1.0kV
HBM all pins 7.5kV
CDM all pins 1.0kV
CC
supply
4
1B
1B
2B
2B
Figure 4. ESD Immunity with 100Ω Resistor
0
1
0
1
Analog Switch Supply Rail
Figure 3. IEC 61000-4-2 ESD Test Model
Figure 1. Human Body ESD Test Model
Figure 2. HBM Current Waveform
100
V
CC
1A
1S
2A
2S
Ultra-portable Connector
www.fairchildsemi.com
ESD Event