FQB34P10 Fairchild Semiconductor, FQB34P10 Datasheet
FQB34P10
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FQB34P10 Summary of contents
Page 1
... D FQB34P10 / FQI34P10 Units -100 V -33.5 A -23.5 A -134 2200 mJ -33.5 A 15.5 mJ -6.0 V/ns 3 ...
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... -33.5A, di/dt 300A Starting DSS, 4. Pulse Test : Pulse width 300 s, Duty cycle 5. Essentially independent of operating temperature ©2004 Fairchild Semiconductor Corporation T = 25°C unless otherwise noted C Test Conditions -250 -250 A, Referenced to 25° -100 V, V ...
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... C 2500 rss 2000 1500 1000 500 Drain-Source Voltage [V] DS Figure 5. Capacitance Characteristics ©2004 Fairchild Semiconductor Corporation 2 10 175 ℃ ℃ Note : ※ 1. 250µ s Pulse Test ℃ Figure 2. Transfer Characteristics ...
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... T = 175 Single Pulse - Drain-Source Voltage [V] DS Figure 9. Maximum Safe Operating Area ©2004 Fairchild Semiconductor Corporation (Continued) 2.5 2.0 1.5 1.0 Notes : ※ 0 -250 µA D 0.0 100 150 200 -100 o C] Figure 8. On-Resistance Variation ...
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... Unclamped Inductive Switching Test Circuit & Waveforms -10V -10V ©2004 Fairchild Semiconductor Corporation Gate Charge Test Circuit & Waveform Same Type Same Type as DUT as DUT -10V -10V DUT DUT ...
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... Peak Diode Recovery dv/dt Test Circuit & Waveforms Driver ) ( Driver ) DUT ) ( DUT ) DUT ) ( DUT ) ©2004 Fairchild Semiconductor Corporation + + DUT DUT Driver Driver Compliment of DUT Compliment of DUT ...
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... Mechanical Dimensions ©2004 Fairchild Semiconductor Corporation PAK Dimensions in Millimeters Rev. B, June 2004 ...
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... Mechanical Dimensions ©2004 Fairchild Semiconductor Corporation PAK Dimensions in Millimeters Rev. B, June 2004 ...
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... TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended exhaustive list of all such trademarks. ® A CEx™ FAST FASTr™ ActiveArray™ Bottomless™ FPS™ FRFET™ CoolFET™ GlobalOptoisolator™ ...