ST72260G1 STMicroelectronics, ST72260G1 Datasheet - Page 142

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ST72260G1

Manufacturer Part Number
ST72260G1
Description
8-BIT MCU WITH FLASH OR ROM MEMORY, ADC, TWO 16-BIT TIMERS, I2C, SPI, SCI INTERFACES
Manufacturer
STMicroelectronics
Datasheet

Specifications of ST72260G1

4 K Or 8 Kbytes Program Memory
ROM or single voltage extended Flash (XFlash) with read-out protection, write protection, In-Circuit Programming and In-Application Programming (ICP and IAP). 10K write/erase cycles guaranteed, data retention
Clock Sources
crystal/ceramic resonator oscillators, internal RC oscillator and bypass for external clock
4 Power Saving Modes
Halt, Active Halt,Wait and Slow
Two 16-bit Timers With
2 input captures, 2 output compares, external clock input on one timer, PWM and Pulse generator modes
ST72260Gx, ST72262Gx, ST72264Gx
EMC CHARACTERISTICS (Cont’d)
13.7.2 Electro Magnetic Interference (EMI)
Based on a simple application running on the
product (toggling 2 LEDs through the I/O ports),
the product is monitored in terms of emission. This
emission test is in line with the norm SAE J 1752/
3 which specifies the board and the loading of
each pin.
13.7.3 Absolute Maximum Ratings (Electrical
Sensitivity)
Based on three different tests (ESD, LU and DLU)
using specific measurement methods, the product
is stressed in order to determine its performance in
terms of electrical sensitivity. For more details, re-
fer to the application note AN1181.
Absolute Maximum Ratings
Notes:
1. Data based on characterization results, not tested in production.
142/172
Symbol
V
V
Symbol
ESD(HBM)
S
ESD(MM)
EMI
Peak level
Electro-static discharge voltage
(Human Body Model)
Electro-static discharge voltage
(Machine Model)
Parameter
Ratings
V
conforming to SAE J 1752/3
DD
=5V, T
Conditions
A
=+25°C,
T
T
A
A
=+25°C
=+25°C
13.7.3.1 Electro-Static Discharge (ESD)
Electro-Static Discharges (a positive then a nega-
tive pulse separated by 1 second) are applied to
the pins of each sample according to each pin
combination. The sample size depends on the
number of supply pins in the device (3 parts*(n+1)
supply pin). Two models can be simulated: Human
Body Model and Machine Model. This test con-
forms to the JESD22-A114A/A115A standard.
0.1MHz to 30MHz
30MHz to 130MHz
130MHz to 1GHz
SAE EMI Level
Frequency Band
Conditions
Monitored
Max vs. [f
8/4MHz
2.5
10
13
16
Maximum value
OSC
2000
200
16/8MHz
/f
13
24
31
4
CPU
]
1)
dBµV
Unit
Unit
-
V

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