ST72324BK2 STMicroelectronics, ST72324BK2 Datasheet - Page 157

• Manufacturer Part Number: ST72324BK2
• Description: 5V RANGE 8-BIT MCU WITH 8 TO 32K FLASH/ROM, 10-BIT ADC, 4 TIMERS, SPI, SCI INTERFACE
• Manufacturer: STMicroelectronics

Specifications of ST72324BK2

• Hdflash Endurance: 1 kcycle at 55 °C, data retention 40 years at 85 °C
• Clock Sources: crystal/ceramic resonator oscillators, int. RC osc. and ext. clock input
• 4 Power Saving Modes: Slow, Wait, Active-halt, and Halt

ST72324Bxx
12.8.3
Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
For more details, refer to the application note AN1181.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models
can be simulated: human body model and machine model. This test conforms to the
JESD22-A114A/A115A standard.
Table 104. Absolute maximum ratings
1. Data based on characterization results, not tested in production.
Static latch-up
●
Table 105. Electrical sensitivities
Symbol
V
V
Symbol
ESD(HBM)
ESD(CDM)
LU
LU: two complementary static tests are required on 6 parts to assess the latch-up
performance. A supply overvoltage (applied to each power supply pin) and a current
injection (applied to each input, output and configurable I/O pin) are performed on each
sample. This test conforms to the EIA/JESD 78 IC latch-up standard.
Static latch-up class
Electrostatic discharge voltage
(human body model)
Electrostatic discharge voltage
(charged device model)
Parameter
Ratings
T
T
T
A
A
A
= +25 °C
= +85 °C
= +125 °C
Conditions
T
A
= +25 °C
Conditions
specification
JESD 78
Electrical characteristics
Test
Maximum value
2000
750
II level A
Class
(1)
157/193
Unit
V