CYNSE70256-66BHC Cypress Semiconductor Corp, CYNSE70256-66BHC Datasheet - Page 97

• Manufacturer Part Number: CYNSE70256-66BHC
• Manufacturer: Cypress Semiconductor Corp

Specifications of CYNSE70256-66BHC

• Operating Temp Range: 0C to 70C
• Operating Temperature Classification: Commercial
• Package Type: BGA
• Mounting: Surface Mount
• Lead Free Status / Rohs Status: Not Compliant

Device ID Register.
TRST_L to ground through a pull-down
Table 15-1. Supported Operations
Table 15-2. TAP Device ID Register
16.0
This section describes the electrical specifications, capacitance, operating conditions, DC characteristics, and AC timing param-
eters for the CYNSE70256 device (see Table 16-1 and Table 16-2).
Table 16-1. DC Electrical Characteristics for CYNSE70256
Document #: 38-02035 Rev. *E
Note:
I
I
V
V
V
V
V
V
V
V
I
I
I
I
SAMPLE/PRELOA
35. To disable JTAG functionality, connect the TCK, TMS, and TDI pins toVDDQ through a pull-up, and TRST_L to ground through a pull-down.
LI
LO
DD2
DD2
DDl
DDl
Parameter
Part Number
IL
IH
OL
OH
IL
IH
OL
OH
Revision
Instruction
MFID
Field
EXTEST
BYPASS
IDCODE
LSB
CLAMP
HIGHZ
D
Electrical Specifications
Input leakage current
Output leakage current
Input LOW voltage (2.5V)
Input HIGH voltage (2.5V)
Output LOW voltage (2.5V)
Output HIGH voltage (2.5V)
Input LOW voltage (3.3V)
Input HIGH voltage (3.3V)
Output LOW voltage (3.3V)
Output HIGH voltage (3.3V)
3.3V/2.5V supply current at V
3.3V/2.5V supply current at V
1.5V supply current at V
1.5V supply current at V
[31:28]
[27:12]
Range
[35]
[11:1]
Mandatory
Mandatory
Mandatory
[0]
Optional
Optional
Optional
Note: To disable JTAG functionality, connect the TCK, TMS and TDI pins to VDDQ through a pull-up, and
Type
Description
0000 0000 0000 0100
Sample/Preload
boundary scan shift register to provide a snapshot of the normal functional operation.
External Test
tivity external to the device.
Bypass
between TDI and TDO and provides a minimum-length serial path when no test operation is
required.
Device JTAG ID Code
IDCODE field serially through TDO.
Output Clamp
High-Z Output
000_1101_1100
Initial Value
DD
DD
. This operation bypasses the device in a JTAG chain by loading a single bit shift register
0001
(Typical)
(Typical)
1
DD
DD
. This operation uses boundary scan values shifted in from the TAP to test connec-
. This operation drives preset values onto the outputs of the device.
. This operation sets the device output signals in high impedance state.
Max
Max
. This operation loads the values of signals going to and from I/O pins into the
. This operation selects the JTAG Identification register and output the
V
V
V
V
V
V
83-MHz search rate, l
66-MHz search rate, l
83-MHz search rate
66-MHz search rate
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
Revision Number
start from one and increment by one for each revision of the device.
This is the part number for the device.
Manufacturer ID
in the TAP controller.
Least significant bit.
= V
= V
= V
= V
= V
= V
DDQ
DDQ
DDQ
DDQ
DDQ
DDQ
Max, V
Max, V
Min, I
Min, I
Min, I
Min, I
Conditions
Description
. This field is the same as the manufacturer ID used
. This is the current device revision number. Numbers
OL
OH
OL
OH
IN
IN
OUT
OUT
= 8mA
= 8mA
= 0 to V
=0 to V
= 8mA
= 8mA
= 0mA
= 0mA
Description
DDQ
DDQ
Max
Max
Min.
–0.3
–20
–20
-0.3
1.7
2.0
2.0
2.4
CYNSE70256
Page 97 of 109
V
V
7.4
5.9
Max.
DDQ
DDQ
600
480
0.7
0.3
0.4
0.8
0.3
0.4
20
20
[41]
[41]
+
+
Unit
mA
mA
µ
µ
V
V
V
V
V
V
A
A
A
A