2N3904BU Fairchild Semiconductor, 2N3904BU Datasheet - Page 3

• Manufacturer Part Number: 2N3904BU
• Description: IC TRANS NPN SS GP 200MA TO-92
• Manufacturer: Fairchild Semiconductor

Specifications of 2N3904BU

• Transistor Type: NPN
• Current - Collector (ic) (max): 200mA
• Voltage - Collector Emitter Breakdown (max): 40V
• Vce Saturation (max) @ Ib, Ic: 300mV @ 5mA, 50mA
• Dc Current Gain (hfe) (min) @ Ic, Vce: 100 @ 10mA, 1V
• Power - Max: 625mW
• Frequency - Transition: 300MHz
• Mounting Type: Through Hole
• Package / Case: TO-92-3 (Standard Body), TO-226
• Transistor Polarity: NPN
• Number Of Elements: 1
• Collector-emitter Voltage: 40V
• Collector-base Voltage: 60V
• Emitter-base Voltage: 6V
• Collector Current (dc) (max): 200mA
• Dc Current Gain (min): 100
• Power Dissipation: 625mW
• Frequency (max): 300MHz
• Operating Temp Range: -55C to 150C
• Operating Temperature Classification: Military
• Mounting: Through Hole
• Pin Count: 3
• Package Type: TO-92
• Configuration: Single
• Mounting Style: Through Hole
• Collector- Emitter Voltage Vceo Max: 40 V
• Emitter- Base Voltage Vebo: 6 V
• Continuous Collector Current: 0.2 A
• Maximum Dc Collector Current: 0.2 A
• Maximum Operating Frequency: 300 MHz
• Maximum Operating Temperature: + 150 C
• Dc Collector/base Gain Hfe Min: 100
• Minimum Operating Temperature: - 55 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Current - Collector Cutoff (max): -
• Lead Free Status / Rohs Status: Compliant
• Other names: 2N3904FS

Lot
Q20070371AAPRCL
Q20070371ABPRCL
Q20070371BAPRCL
Test: (Temperature Humidity Biased Test)
Lot
Q20070371AATHBT
Q20070371ABTHBT
Q20070371BATHBT
Test: -65C, 150C (Temperature Cycle)
Lot
Q20070371AATMCL1
Q20070371AATMCL1
Q20070371ABTMCL1
Q20070371ABTMCL1
Q20070371BATMCL1
Q20070371BATMCL1
Test: Ambient Storage for Whisker Growth (Storage Bake)
Lot
Q20070371AASBAKE
Q20070371ABSBAKE
Q20070371BASBAKE
Test: TMCL for Whisker Growth (Temperature Cycle)
Lot
Q20070371AATMCL4
Q20070371ABTMCL4
Q20070371BATMCL4
Test: Temp/Humidity Storage for Whisker Growth (Aging Bake)
Lot
Q20070371AAABAKE
Q20070371ABABAKE
Q20070371BAABAKE
Product Id Description :
Affected FSIDs :
2N3904BU
2N3904CTA
Device
KSB564ACGBU
KSP44BU_NL
Device
KSB564ACGBU
KSP44BU_NL
Device
KSB564ACGBU
KSP44BU_NL
Device
KSB564ACGBU
KSP44BU_NL
Device
KSB564ACGBU
KSB564ACGBU
KSB564ACGBU
KSB564ACGBU
KSP44BU_NL
KSP44BU_NL
Device
KSB564ACGBU
KSB564ACGBU
KSP44BU_NL
2N3904BU_NL
2N3904NLBU
168-HOURS
0/77
0/77
0/129
2000-HOURS
0/3
0/3
0/3
500-CYCLES
0/3
0/3
0/3
2000-HOURS
0/3
0/3
0/3
200-CYCLES
0/77
0/77
0/77
5000-CYCLES
0/77
0/77
0/77
500-HOURS
0/77
0/77
0/129
3000-HOURS
0/3
0/3
0/3
1000-CYCLES
0/3
0/3
0/3
3000-HOURS
0/3
0/3
0/3
500-CYCLES
0/77
0/77
0/77
1000-HOURS
0/77
0/77
1/129
4000-HOURS
0/3
0/3
0/3
1500
0/3
0/3
0/3
4000-HOURS
0/3
0/3
0/3
2N3904CBU
2N3904TA
Failure Code
Failure Code
Bake Recoverable
(Moisture Induced
Leakage)
Failure Code
Failure Code
Failure Code
Failure Code
Pg. 3