FDW2601NZ Fairchild Semiconductor, FDW2601NZ Datasheet
FDW2601NZ
Specifications of FDW2601NZ
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FDW2601NZ Summary of contents
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... This notification is for your information and concurrence. This is a preliminary notification. A Final PCN will be issued when qualification is complete and data is available. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. If you have any questions concerning this change, please contact: ...
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Change To Qualification Stress Test and Sample Size Detail Device #1 FDW2508PB Package: -1 #Leads: -1 Precondition Description: Stress P/C Standard PCNL1A JESD22-A113 Environment Stress Detail: Stress P/C Standard ACLV X JESD22-A102 100%RH, 121C 96 H3TRB X JESD22-A101B85%RH, 85C, HTGB ...
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... X JESD22-A102 100%RH, 121C 96 H3TRB X JESD22-A101B85%RH, 85C, HTGB JESD22-A108 150C, 100% of HTRB JESD22-A108 150C, 80% of re- PRCL MIL- STD-750-1036 TMCL1 X JESD22-A104 -65C, 150C Device #3 FDW2601NZ Package: #Leads: Precondition Description: Stress P/C Standard PCNL1A JESD22-A113 Environment Stress Detail: Stress P/C Standard ACLV X JESD22-A102 100%RH, 121C 96 ...
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SI6955DQ Pg. 4 ...