FDG6304P Fairchild Semiconductor, FDG6304P Datasheet
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FDG6304P
Specifications of FDG6304P
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FDG6304P Summary of contents
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... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...
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Results/Discussion Test: (Autoclave) Lot Device Q20070416AAACLV FDG313N Q20070416ABACLV FDG313N Q20070416ACACLV FDG313N Q20070416BAACLV FDG6323L Q20070416BBACLV FDG6323L Q20070416BCACLV FDG6323L Q20070416CAACLV FDG361N Q20070416DAACLV NC7WZ17P6X Test: (High Humidity, High Temp, Rev. Bias) Lot Device Q20070416AAH3TRB FDG313N Q20070416ABH3TRB FDG313N Q20070416ACH3TRB FDG313N Test: (High Temperature Gate ...
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Q20070416CAHTGB FDG361N Q20070416CAHTGB FDG361N Test: (High Temperature Reverse Bias) Lot Device Q20070416AAHTRB FDG313N Q20070416AAHTRB FDG313N Q20070416ABHTRB FDG313N Q20070416ABHTRB FDG313N Q20070416ACHTRB FDG313N Q20070416ACHTRB FDG313N Q20070416CAHTRB FDG361N Q20070416CAHTRB FDG361N Test: (Power Cycle) Lot Device Q20070416AAPRCL FDG313N Q20070416AAPRCL FDG313N Q20070416ABPRCL FDG313N Q20070416ABPRCL FDG313N ...
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... FDG315N FDG326P FDG327NZ FDG328P_NL FDG332PZ FDG6301N_NL FDG6303N_NL FDG6304P_NL FDG6306P_SBGX002 FDG6316P FDG6318P FDG6320C FDG6321C_NL FDG6323L FDG6331L FDG6332C_NL FDG6335N_NL FDG8850NZ Failure Code Failure Code FDG312P FDG313N_NL FDG316P FDG326P_NL FDG327N_NL FDG329N FDG361N FDG6302P FDG6304P FDG6306P FDG6308P FDG6316P_NL FDG6318PZ FDG6320C_NL FDG6322C FDG6323L_NL FDG6331L_NL FDG6335N FDG6342L Pg. 5 ...