MPU-6050 INVENSENSE, MPU-6050 Datasheet - Page 51

• Manufacturer Part Number: MPU-6050
• Description: GYRO/ACCEL, 9-AXIS FUSION, PROG, I2C
• Manufacturer: INVENSENSE

Specifications of MPU-6050

• No. Of Axes: 9
• Sensor Case Style: QFN
• No. Of Pins: 24
• Supply Voltage Range: 2.5V To 3.6V
• Operating Temperature Range: -40°C To +85°C
• Interface: I2C
• Acceleration Range: ± 2g, ± 4g, ± 8g, ± 16g
• Interface Type: I2C, SPI
• Rohs Compliant: Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

13.1 Qualification Test Policy
InvenSense’s products complete a Qualification Test Plan before being released to production. The
Qualification Test Plan for the MPU-60X0 followed the JEDEC 47G.01 Standards, “Stress-Test-Driven
Qualification of Integrated Circuits,” with the individual tests described below.
13.2 Qualification Test Plan
TEST
High Temperature
Operating Life
(HTOL/LFR)
Highly Accelerated Stress
Test
High Temperature
Storage Life (HTS)
TEST
ESD-HBM
ESD-MM
Latch Up
Mechanical Shock
Vibration
Temperature Cycling (TC)
TEST
Board Mechanical Shock
Board
Temperature Cycling (TC)
(1)
13 Reliability
(HAST)
MPU-6000/MPU-6050 Product Specification
(1)
(1)
Method/Condition
JEDEC JESD22-A108C, Dynamic,
3.63V biased, Tj>125°C
[read-points 168, 500, 1000 hours]
JEDEC JESD22-A118
Condition A, 130°C, 85%RH, 33.3 psia.,
unbiased, [read-point 96 hours]
JEDEC JESD22-A103C, Cond. A, 125°C,
Non-Biased Bake
[read-points 168, 500, 1000 hours]
Method/Condition
JEDEC JESD22-A114F, (1.5KV)
JEDEC JESD22-A115-A, (200V)
JEDEC JESD78B Level 2, 125C, +/- 60mA
JEDEC JESD22-B104C,
Mil-Std-883H, method 2002.5,
Cond. E, 10,000g’s, 0.2ms,
±X, Y, Z – 6 directions, 5 times/direction
JEDEC JESD22-B103B, Variable Frequency
(random), Cond. B, 5-500Hz,
X, Y, Z – 4 times/direction
JEDEC JESD22-A104D Condition N,
[-40°C to +85°C], Soak Mode 2 [5’], 100 cycles
Method/Condition
JEDEC JESD22-B104C,
Mil-Std-883H, method 2002.5,
Cond. E, 10000g’s, 0.2ms,
+-X, Y, Z – 6 directions, 5 times/direction
JEDEC JESD22-A104D Condition N,
[ -40°C to +85°C], Soak Mode 2 [5’], 100 cycles
Device Component Level Tests
Accelerated Life Tests
Board Level Tests
51 of 53
Document Number: PS-MPU-6000A-00
Revision: 1.0
Release Date: 11/24/2010
Quantity
Quantity
Quantity
Lot
Lot
Lot
3
3
3
1
1
1
1
1
3
3
3
Sample
Sample
Sample
/ Lot
/ Lot
/ Lot
77
77
77
77
40
3
3
6
5
5
5
Criteria
Criteria
Criteria
Reject
Reject
Reject
Acc /
Acc /
Acc /
(0/1)
(0/1)
(0/1)
(0/1)
(0/1)
(0/1)
(0/1)
(0/1)
(0/1)
(0/1)
(0/1)