AT88SC3216CRF-MVB1G Atmel, AT88SC3216CRF-MVB1G Datasheet - Page 67

• Manufacturer Part Number: AT88SC3216CRF-MVB1G
• Description: CRYPTOMEMORY 32KBIT 16ZONE MVB
• Manufacturer: Atmel
• Series: CryptoMemory®, CryptoRF®r

Specifications of AT88SC3216CRF-MVB1G

• Rf Type: Read / Write
• Frequency: 13.56MHz
• Features: ISO1444-2, 1444-3, 32-kbits
• Package / Case: MVB Module
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

8.
9.
5276C–RFID–3/09
Absolute Maximum Ratings*
The maximum temperature ratings in this section are applicable to CryptoRF in wafer form. When assembled into a
package the CryptoRF temperature ratings may be reduced to reflect the limitations of the package. However the
CryptoRF absolute maximum ratings should not be exceeded for any package.
Reliability
Table 56.
CryptoRF is fabricated with Atmel’s high reliability CMOS EEPROM manufacturing technology. The write endurance
and data retention EEPROM reliability ratings apply to each byte of the user and configuration memory.
The optional CryptoRF anti-tearing functions use a single anti-tearing EEPROM buffer memory. Every anti-tearing write
operation utilizes the same buffer. The anti-tearing write endurance specification is a limitation in the total number of
anti-tearing write operations that can be performed by each die.
Write Endurance (each Byte)
Anti-Tearing Write Endurance
Data Retention (at 55°C)
Data Retention (At 35°C)
Read Endurance
Operating Temperature (junction) .............−40°C to +85°C
Storage Temperature (ambient).............−65°C to + 150°C
HBM ESD (Antenna Pins only) ................ 2000V minimum
Reliability
Parameter
AT88SC0808/1616/3216/6416CRF, AT88RF04C
100,000
50,000
Min
10
30
*NOTICE: Stresses beyond those listed under “Absolute
Unlimited
Typical
50
Maximum Ratings” may cause permanent
damage to the device. This is a stress rating
only and functional operation of the device at
these or any other condition beyond those
indicated in the operational sections of this
specification is not implied. Exposure to
absolute
extended periods may affect device reliability.
maximum
Max
rating
conditions
Read Cycles
Write Cycles
Writes
Years
Years
Units
for
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