MCF52110CVM80J Freescale Semiconductor, MCF52110CVM80J Datasheet - Page 31
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MCF52110CVM80J
Manufacturer Part Number
MCF52110CVM80J
Description
IC MCU 128K FLASH 80MHZ 81MAPBGA
Manufacturer
Freescale Semiconductor
Series
MCF521xxr
Datasheet
1.MCF52110CAF80.pdf
(56 pages)
Specifications of MCF52110CVM80J
Core Processor
Coldfire V2
Core Size
32-Bit
Speed
80MHz
Connectivity
I²C, SPI, UART/USART
Peripherals
DMA, LVD, POR, PWM, WDT
Number Of I /o
56
Program Memory Size
128KB (128K x 8)
Program Memory Type
FLASH
Ram Size
16K x 8
Voltage - Supply (vcc/vdd)
3 V ~ 3.6 V
Data Converters
A/D 8x12b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
81-MAPBGA
Processor Series
MCF521x
Core
ColdFire V2
3rd Party Development Tools
JLINK-CF-BDM26, EWCF
Development Tools By Supplier
M52210DEMO, M52211EVB
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Eeprom Size
-
Lead Free Status / Rohs Status
Details
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
MCF52110CVM80J
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
Electrical Characteristics
2.6
2.7
31
Supply voltage
Standby voltage
Input high voltage
Input low voltage
Input hysteresis
Low-voltage detect trip voltage (V
Low-voltage detect hysteresis (V
Input leakage current
Output high voltage (all input/output and all output pins)
I
Output low voltage (all input/output and all output pins)
I
OH
OL
V
= 2.0mA
= –2.0 mA
in
= V
ESD Protection
DC Electrical Specifications
DD
or V
1
2
Characteristics
ESD target for Human Body Model
ESD target for Machine Model
HBM circuit description
MM circuit description
Number of pulses per pin (HBM)
Number of pulses per pin (MM)
Interval of pulses
2
• Positive pulses
• Negative pulses
• Positive pulses
• Negative pulses
SS
All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for
Automotive Grade Integrated Circuits.
A device is defined as a failure if after exposure to ESD pulses the device no longer
meets the device specification requirements. Complete DC parametric and functional
testing is performed per applicable device specification at room temperature followed by
hot temperature, unless specified otherwise in the device specification.
, digital pins
Characteristic
DD
DD
Table 26. ESD Protection Characteristics
rising)
falling)
Table 27. DC Electrical Specifications
MCF52110 ColdFire Microcontroller, Rev. 1
Symbol
R
R
HBM
MM
series
series
—
—
—
—
—
C
C
V
Symbol
V
LVDHYS
V
V
V
V
V
STBY
V
V
HYS
I
LVD
Value
DD
OH
in
OL
2000
1500
IH
IL
200
100
200
0
1
1
3
3
1
1
1, 2
0.06 V
0.7 V
V
V
SS
DD
2.15
–1.0
Min
3.0
1.8
60
—
– 0.3
– 0.5
DD
DD
Units
sec
pF
pF
—
—
V
V
Freescale Semiconductor
0.35 V
Max
120
3.6
3.5
4.0
2.3
1.0
0.5
—
—
DD
Unit
mV
mV
A
V
V
V
V
V
V
V