MCF52110CVM80J Freescale Semiconductor, MCF52110CVM80J Datasheet - Page 31

• Manufacturer Part Number: MCF52110CVM80J
• Description: IC MCU 128K FLASH 80MHZ 81MAPBGA
• Manufacturer: Freescale Semiconductor
• Series: MCF521xxr

Specifications of MCF52110CVM80J

• Core Processor: Coldfire V2
• Core Size: 32-Bit
• Speed: 80MHz
• Connectivity: I²C, SPI, UART/USART
• Peripherals: DMA, LVD, POR, PWM, WDT
• Number Of I /o: 56
• Program Memory Size: 128KB (128K x 8)
• Program Memory Type: FLASH
• Ram Size: 16K x 8
• Voltage - Supply (vcc/vdd): 3 V ~ 3.6 V
• Data Converters: A/D 8x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 81-MAPBGA
• Processor Series: MCF521x
• Core: ColdFire V2
• 3rd Party Development Tools: JLINK-CF-BDM26, EWCF
• Development Tools By Supplier: M52210DEMO, M52211EVB
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Details

Electrical Characteristics
2.6
2.7
31
Supply voltage
Standby voltage
Input high voltage
Input low voltage
Input hysteresis
Low-voltage detect trip voltage (V
Low-voltage detect hysteresis (V
Input leakage current
Output high voltage (all input/output and all output pins)
I
Output low voltage (all input/output and all output pins)
I
OH
OL
V
= 2.0mA
= –2.0 mA
in
= V
ESD Protection
DC Electrical Specifications
DD
or V
1
2
Characteristics
ESD target for Human Body Model
ESD target for Machine Model
HBM circuit description
MM circuit description
Number of pulses per pin (HBM)
Number of pulses per pin (MM)
Interval of pulses
2
• Positive pulses
• Negative pulses
• Positive pulses
• Negative pulses
SS
All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for
Automotive Grade Integrated Circuits.
A device is defined as a failure if after exposure to ESD pulses the device no longer
meets the device specification requirements. Complete DC parametric and functional
testing is performed per applicable device specification at room temperature followed by
hot temperature, unless specified otherwise in the device specification.
, digital pins
Characteristic
DD
DD
Table 26. ESD Protection Characteristics
rising)
falling)
Table 27. DC Electrical Specifications
MCF52110 ColdFire Microcontroller, Rev. 1
Symbol
R
R
HBM
MM
series
series
—
—
—
—
—
C
C
V
Symbol
V
LVDHYS
V
V
V
V
V
STBY
V
V
HYS
I
LVD
Value
DD
OH
in
OL
2000
1500
IH
IL
200
100
200
0
1
1
3
3
1
1
1, 2
0.06  V
0.7  V
V
V
SS
DD
2.15
–1.0
Min
3.0
1.8
60
—
– 0.3
– 0.5
DD
DD
Units
sec
pF
pF
—
—


V
V
Freescale Semiconductor
0.35  V
Max
120
3.6
3.5
4.0
2.3
1.0
0.5
—
—
DD
Unit
mV
mV
A
V
V
V
V
V
V
V