AT91SAM7X256B-AU Atmel, AT91SAM7X256B-AU Datasheet - Page 45

• Manufacturer Part Number: AT91SAM7X256B-AU
• Description: IC MCU 256KB FLASH 100LQFP
• Manufacturer: Atmel
• Series: AT91SAMr

Specifications of AT91SAM7X256B-AU

• Core Processor: ARM7
• Core Size: 16/32-Bit
• Speed: 55MHz
• Connectivity: CAN, Ethernet, I²C, SPI, SSC, UART/USART, USB
• Peripherals: Brown-out Detect/Reset, DMA, POR, PWM, WDT
• Number Of I /o: 62
• Program Memory Size: 256KB (256K x 8)
• Program Memory Type: FLASH
• Ram Size: 64K x 8
• Voltage - Supply (vcc/vdd): 1.65 V ~ 1.95 V
• Data Converters: A/D 8x10b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 100-LQFP
• Package: 100LQFP
• Device Core: ARM7TDMI
• Family Name: 91S
• Maximum Speed: 55 MHz
• Operating Supply Voltage: 1.8|3.3 V
• Data Bus Width: 32 Bit
• Number Of Programmable I/os: 62
• Interface Type: CAN/Ethernet/SPI/I2S/TWI/USART/USB
• On-chip Adc: 8-chx10-bit
• Number Of Timers: 3
• Controller Family/series: AT91SAM7xxxxx
• No. Of I/o's: 62
• Ram Memory Size: 64KB
• Cpu Speed: 55MHz
• No. Of Timers: 1
• Rohs Compliant: Yes
• Cpu Family: 91S
• Device Core Size: 32b
• Frequency (max): 55MHz
• Total Internal Ram Size: 64KB
• # I/os (max): 62
• Number Of Timers - General Purpose: 3
• Operating Supply Voltage (typ): 1.8/3.3V
• Operating Supply Voltage (max): 1.95/3.6V
• Operating Supply Voltage (min): 1.65/3V
• Instruction Set Architecture: RISC
• Operating Temp Range: -40C to 85C
• Operating Temperature Classification: Industrial
• Mounting: Surface Mount
• Pin Count: 100
• Package Type: LQFP
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Compliant

12. Debug and Test Features
12.1
12.2
6120H–ATARM–17-Feb-09
Description
Block Diagram
The AT91SAM7X Series features a number of complementary debug and test capabilities. A
common JTAG/ICE (In-Circuit Emulator) port is used for standard debugging functions, such as
downloading code and single-stepping through programs. The Debug Unit provides a two-pin
UART that can be used to upload an application into internal SRAM. It manages the interrupt
handling of the internal COMMTX and COMMRX signals that trace the activity of the Debug
Communication Channel.
A set of dedicated debug and test input/output pins gives direct access to these capabilities from
a PC-based test environment.
Figure 12-1. Debug and Test Block Diagram
PDC
Boundary
ARM7TDMI
TAP
DBGU
ICE
AT91SAM7X512/256/128 Preliminary
ICE/JTAG
TAP
Reset
and
Test
POR
TMS
TCK
TDI
JTAGSEL
TDO
DTXD
DRXD
TST
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