PCF2129AT NXP [NXP Semiconductors], PCF2129AT Datasheet - Page 55

• Manufacturer Part Number: PCF2129AT
• Description: Integrated RTC, TCXO and quartz crystal
• Manufacturer: NXP [NXP Semiconductors]

NXP Semiconductors
Table 53.
V
[1]
[2]
PCF2129A_1
Product data sheet
Symbol
f
Δf/f
Δf
Δf/ΔV
o
DD
xtal
±1 ppm corresponds to a time deviation of ±0.0864 seconds per day.
Not production tested. Effects of reflow solder not included (see
= 1.8 V to 4.2 V; V
/f
xtal
Parameter
output frequency
frequency stability
relative crystal frequency variation
frequency variation with voltage
Frequency characteristics
12.2 Frequency characteristics
SS
= 0 V; T
Fig 40. Characteristic of frequency with respect to temperature
Frequency
stability
(1) Temperature compensated frequency.
(2) Uncompensated typical tuning-fork crystal frequency.
(ppm)
amb
−40
−80
40
0
−40
= +25
(1)
°
± 10 ppm
C, unless otherwise specified.
(2)
−20
Conditions
on pin CLKOUT;
V
COF[2:0] = 000;
AO[3:0] = 1000
V
crystal aging, first year;
V
on pin CLKOUT
Rev. 01 — 13 January 2010
DD
DD
DD
T
T
and
T
amb
amb
amb
or V
or V
or V
= −15 °C to +60 °C
= −25 °C to −15 °C
= +60 °C to +65 °C
BAT
BAT
BAT
0
Ref. 3
= 3.3 V;
= 3.3 V
= 3.3 V
“AN10857”).
20
± 5 ppm
Integrated RTC, TCXO and quartz crystal
40
[1]
[1]
[2]
Min
-
-
-
-
-
± 10 ppm
60
Typ
32.768 -
±3
±5
-
±1
Temperature (°C)
PCF2129A
80
© NXP B.V. 2010. All rights reserved.
001aaj650
Max
±5
±10
±3
-
100
Unit
kHz
ppm
ppm
ppm
ppm/V
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