EP2SGX60EF1152I4 Altera, EP2SGX60EF1152I4 Datasheet - Page 308

IC STRATIX II GX 60K 1152-FBGA

EP2SGX60EF1152I4

Manufacturer Part Number
EP2SGX60EF1152I4
Description
IC STRATIX II GX 60K 1152-FBGA
Manufacturer
Altera
Series
Stratix® II GXr
Datasheet

Specifications of EP2SGX60EF1152I4

Number Of Logic Elements/cells
60440
Number Of Labs/clbs
3022
Total Ram Bits
2544192
Number Of I /o
534
Voltage - Supply
1.15 V ~ 1.25 V
Mounting Type
Surface Mount
Operating Temperature
-40°C ~ 100°C
Package / Case
1152-FBGA
Family Name
Stratix II GX
Number Of Logic Blocks/elements
60440
# I/os (max)
534
Frequency (max)
732.1MHz
Process Technology
SRAM
Operating Supply Voltage (typ)
1.2V
Logic Cells
60440
Ram Bits
2544192
Operating Supply Voltage (min)
1.15V
Operating Supply Voltage (max)
1.25V
Operating Temp Range
-40C to 100C
Operating Temperature Classification
Industrial
Mounting
Surface Mount
Pin Count
1152
Package Type
FC-FBGA
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Number Of Gates
-
Lead Free Status / Rohs Status
Not Compliant
Other names
544-2186

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
EP2SGX60EF1152I4
Manufacturer:
Altera
Quantity:
10 000
Part Number:
EP2SGX60EF1152I4
Manufacturer:
ALTERA
0
Part Number:
EP2SGX60EF1152I4N
Manufacturer:
ALTERA
Quantity:
534
Part Number:
EP2SGX60EF1152I4N
Manufacturer:
Altera
Quantity:
10 000
Part Number:
EP2SGX60EF1152I4N
Manufacturer:
ALTERA
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Part Number:
EP2SGX60EF1152I4N
Manufacturer:
ALTERA
Quantity:
300
Part Number:
EP2SGX60EF1152I4N
0
August 2007
v4.4
May 2007 v4.3
Table 4–118. Document Revision History (Part 2 of 5)
Document
Date and
Version
Changed 1.875 KHz to 1.875 MHz in Table 4–19,
Removed note “The data in this table is preliminary.
Altera will provide a report upon completion of
characterization of the Stratix II GX devices.
Conditions for testing the silicon have not been
determined.” from each table.
Removed note “The data in Tables xxx through xxx
is preliminary. Altera will provide a report upon
completion of characterization of the Stratix II GX
devices. Conditions for testing the silicon have not
been determined.” in the clock timing parameters
sections.
Updated clock timing parameter Tables 4–63
through 4–78 (Table 4–75 was unchanged).
Updated Table 4–21 and added new Table 4–22.
Updated:
Added note to Table 4–50.
Added:
Added the “Referenced Documents” section.
XAUI Receiver Jitter Tolerance section.
Table 4–6
Table 4–16
Table 4–19
Table 4–49
Table 4–52
Table 4–107
Figure 4–3
Figure 4–4
Figure 4–5
Changes Made
Summary of Changes

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