N25Q128A13BF840E NUMONYX, N25Q128A13BF840E Datasheet - Page 165

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N25Q128A13BF840E

Manufacturer Part Number
N25Q128A13BF840E
Description
128MBQUAD IO,XIP VDFPN 8X6 3VT&R
Manufacturer
NUMONYX
Datasheet

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Company
Part Number
Manufacturer
Quantity
Price
Part Number:
N25Q128A13BF840E
Manufacturer:
MICRON
Quantity:
20 000
12
13
Initial delivery state
The device is delivered with the memory array erased: all bits are set to 1 (each byte
contains FFh). The Status Register contains 00h (all Status Register bits are 0).
Maximum rating
Stressing the device outside the ratings listed here may cause permanent damage to the
device. These are stress ratings only, and operation of the device at these, or any other
conditions outside those indicated in the operating sections of this specification, is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect
device reliability.
Table 27.
1. Compliant with JEDEC Std. J-STD-020C (for small body, Sn-Pb or Pb assembly), the Numonyx
2. Avoid applying VPP
3. JEDEC Std JESD22-A114A (C1 = 100 pF, R1 = 1500 Ω, R2 = 500 Ω).
Symbol
ECOPACK® 7191395 specification, and the European directive on Restrictions on Hazardous
Substances (RoHS) 2002/95/EU.
T
T
V
VPP
V
LEAD
V
STG
ESD
CC
IO
Absolute maximum ratings
Storage temperature
Lead temperature during soldering
Input and output voltage (with respect to ground)
Supply voltage
Fast program/erase voltage
Electrostatic discharge voltage (human body model)
H
to the W/VPP pin during Bulk Erase.
Parameter
(2)
(3)
–2000
–0.6
–0.6
–0.2
Min
–65
V
CC
see
2000
Max
10.0
150
4.0
+ 0.6
(1)
Unit
165/180
°C
°C
V
V
V
V

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