STEVAL-ISQ002V1 STMicroelectronics, STEVAL-ISQ002V1 Datasheet - Page 141
![BOARD EVAL BASED ON ST72264G1](/photos/9/9/90917/steval-isq002v1_sml.jpg)
STEVAL-ISQ002V1
Manufacturer Part Number
STEVAL-ISQ002V1
Description
BOARD EVAL BASED ON ST72264G1
Manufacturer
STMicroelectronics
Specifications of STEVAL-ISQ002V1
Main Purpose
Interface, PMBus
Embedded
Yes, MCU, 8-Bit
Utilized Ic / Part
ST72F264
Primary Attributes
The PMBus™ Interface Using the ST7 I2C Peripheral
Secondary Attributes
Firmware in C Language
Product
Power Management Modules
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
497-6423
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
STEVAL-ISQ002V1
Manufacturer:
STMicroelectronics
Quantity:
1
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13.7 EMC CHARACTERISTICS
Susceptibility tests are performed on a sample ba-
sis during product characterization.
13.7.1 Functional EMS (Electro Magnetic
Susceptibility)
Based on a simple running application on the
product (toggling 2 LEDs through I/O ports), the
product is stressed by two electro magnetic events
until a failure occurs (indicated by the LEDs).
■
■
A device reset allows normal operations to be re-
sumed. The test results are given in the table be-
low based on the EMS levels and classes defined
in application note AN1709.
13.7.1.1 Designing hardened software to avoid
noise problems
EMC characterization and optimization are per-
formed at component level with a typical applica-
Figure 75. EMC Recommended power supply connection
1. The suggested 10µF and 0.1µF decoupling capacitors on the power supply lines are proposed as a good price vs. EMC
performance tradeoff. They have to be put as close as possible to the device power supply pins. Other EMC recommen-
dations are given in AN1709.
Symbol
ESD: Electro-Static Discharge (positive and
negative) is applied on all pins of the device until
a functional disturbance occurs. This test
conforms with the IEC 1000-4-2 standard.
FTB: A Burst of Fast Transient voltage (positive
and negative) is applied to V
a 100pF capacitor, until a functional disturbance
occurs. This test conforms with the IEC 1000-4-
4 standard.
V
V
FESD
FFTB
POWER
SUPPLY
SOURCE
Voltage limits to be applied on any I/O pin to induce a
functional disturbance
Fast transient voltage burst limits to be applied
through 100pF on V
tional disturbance
V
DD
DD
Parameter
DD
and V
and V
ST7
DIGITAL NOISE
FILTERING
DD
pins to induce a func-
SS
through
10µF
0.1µF
tion environment and simplified MCU software. It
should be noted that good EMC performance is
highly dependent on the user application and the
software in particular.
Therefore it is recommended that the user applies
EMC software optimization and prequalification
tests in relation with the EMC level requested for
his application.
Software recommendations:
The software flowchart must include the manage-
ment of runaway conditions such as:
– Corrupted program counter
– Unexpected reset
– Critical Data corruption (control registers...)
Prequalification trials:
Most of the common failures (unexpected reset
and program counter corruption) can be repro-
duced by manually forcing a low state on the RE-
SET pin or the Oscillator pins for 1 second.
To complete these trials, ESD stress can be ap-
plied directly on the device, over the range of
specification values. When unexpected behaviour
is detected, the software can be hardened to pre-
vent unrecoverable errors occurring (see applica-
tion note AN1015).
V
conforms to IEC 1000-4-2
V
conforms to IEC 1000-4-4
ST72260Gx, ST72262Gx, ST72264Gx
DD
DD
1)
V
V
=5V, T
=5V, T
DD
SS
A
A
=+25°C, f
=+25°C, f
ST72XXX
Conditions
OSC
OSC
=8MHz
=8MHz
141/172
Level/
Class
2B
2B
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