FSDM0365RNB Fairchild Semiconductor, FSDM0365RNB Datasheet
FSDM0365RNB
Manufacturer Part Number
FSDM0365RNB
Description
IC SWIT PWM GREEN CM OVP HV 8DIP
Manufacturer
Fairchild Semiconductor
Datasheet
1.FSDM0365RNB.pdf
(20 pages)
Specifications of FSDM0365RNB
Output Isolation
Isolated
Frequency Range
61 ~ 73kHz
Voltage - Input
8 ~ 20 V
Voltage - Output
650V
Power (watts)
30W
Operating Temperature
25°C ~ 140°C
Package / Case
8-DIP (0.300", 7.62mm)
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
FSDM0365RNB_NL
FSDM0365RNB_NL
FSDM0365RNB_NL
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
FSDM0365RNB
Manufacturer:
Maxim
Quantity:
11
Company:
Part Number:
FSDM0365RNB
Manufacturer:
Fairchi/ON
Quantity:
15 000
Part Number:
FSDM0365RNB
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
This is to inform you that a design and/or process change will be made to the following
product(s). This notification is for your information and concurrence.
If you require data or samples to qualify this change, please contact Fairchild Semiconductor
within 30 days of receipt of this notification.
Updated process quality documentation, such as FMEAs and Control Plans, are available for
viewing upon request.
If you have any questions concerning this change, please contact:
PCN Originator:
Name: Kim, Sangseop
E-mail: Sangseop.Kim@fairchildsemi.com
Phone:
Implementation of change:
Expected 1st Device Shipment Date: 2008/03/12
Earliest Year/Work Week of Changed Product: 8011
Change Type Description: Passivation Material
Description of Change (From): passivation layer without Polyimide coating
Description of Change (To): Polyimide coating will be added on the passivation layer
Reason for Change : Polyimide coating is added to reduce the potential for electrical
performance shift due to surface ionic charge.
Qual/REL Plan Numbers : Q20070388
Qualification :
The qual. result of Polyimide addition is good regarding 1000hr.
Results/Discussion
Test: (Autoclave)
Lot
Q20070388AAACLV
Test: (Gate Leakage Negative)
Lot
Q20070388AAGATE-
Test: (Gate Leakage Positive)
Lot
Q20070388AAGATE+
Test: (High Temperature Op Life)
DESIGN/PROCESS CHANGE NOTIFICATION -- FINAL
Technical Contact:
Name: Kim, Sangseop
E-mail: Sangseop.Kim@fairchildsemi.com
Phone:
Device
FSDH321
Device
FSDH321
Device
FSDH321
96-HOURS
0/77
Results
0/10
Results
0/10
Date Issued On : 2007/12/07
Date Created : 2007/12/04
Failure Code
Failure Code
Failure Code
PCN# : Q4074107-A
Pg. 1
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FSDM0365RNB Summary of contents
Page 1
... This is to inform you that a design and/or process change will be made to the following product(s). This notification is for your information and concurrence. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. Updated process quality documentation, such as FMEAs and Control Plans, are available for viewing upon request ...
Page 2
... FSDL0365RNB FSDL321L_NL FSDM0265RL_NL FSDM0265RNC FSDM0365RL FSDM0365RN FSDM0365RN_NL FSQ0370RNA 1000-HOURS Failure Code 0/77 1000-HOURS Failure Code 0/77 1000-HOURS Failure Code 0/77 1000-HOURS Failure Code 0/77 Failure Code FSDH0265RLD FSDH0265RLD_NL FSDH0265RL_NL FSDH0270RNB FSDH321B FSDH321LX_NL FSDL0165RL FSDL0365RL FSDL321 FSDL321_NL FSDM0265RNB FSDM0265RNC_NL FSDM0365RLX FSDM0365RNB FSQ0170RNA Pg. 2 ...