EVAL-ADXL343Z-M Analog Devices, EVAL-ADXL343Z-M Datasheet - Page 20

• Manufacturer Part Number: EVAL-ADXL343Z-M
• Description: Acceleration Sensor Development Tools EB
• Manufacturer: Analog Devices

Specifications of EVAL-ADXL343Z-M

• Rohs: yes
• Tool Is For Evaluation Of: ADXL343
• Acceleration: 2 g, 4 g, 8 g, 16 g
• Sensing Axis: Triple Axis
• Interface Type: I2C, SPI
• Operating Voltage: 2 V to 3.6 V
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 40 C
• Operating Current: 140 uA
• Output Type: Digital
• Product: Evaluation Systems
• Sensitivity: 256 LSB/g, 128 LSB/g, 64 LSB/g, 32 LSG/g
• Factory Pack Quantity: 1

ADXL343
SELF-TEST
The
tests its mechanical and electronic systems simultaneously.
When the self-test function is enabled (via the SELF_TEST bit
in the DATA_FORMAT register, Address 0x31), an electrostatic
force is exerted on the mechanical sensor. This electrostatic force
moves the mechanical sensing element in the same manner as
acceleration, and it is additive to the acceleration experienced
by the device. This added electrostatic force results in an output
change in the x-, y-, and z-axes. Because the electrostatic force
is proportional to V
effect is shown in Figure 33. The scale factors shown in Table 14
can be used to adjust the expected self-test output limits for
different supply voltages, V
ADXL343
shown in Table 1 and Table 15 to Table 18 are valid for both
potential self-test values due to bimodality. Use of the self-test
feature at data rates less than 100 Hz or at 1600 Hz may yield
values outside these limits. Therefore, the part must be in normal
power operation (LOW_POWER bit = 0 in BW_RATE register,
Address 0x2C) and be placed into a data rate of 100 Hz through
800 Hz or 3200 Hz for the self-test function to operate correctly.
ADXL343
–2
–4
–6
Figure 33. Self-Test Output Change Limits vs. Supply Voltage
6
4
2
0
also exhibits a bimodal behavior. However, the limits
X HIGH
X LOW
Y HIGH
Y LOW
Z HIGH
Z LOW
2.0
incorporates a self-test feature that effectively
S
2
, the output change varies with V
2.5
S
. The self-test feature of the
V
S
(V)
3.3
3.6
S
. This
Rev. 0 | Page 20 of 36
Table 14. Self-Test Output Scale Factors for Different Supply
Voltages, V
Supply Voltage, V
2.00
2.50
3.30
3.60
Table 15. Self-Test Output in LSB for ±2 g, 10-Bit or Full
Resolution (T
Axis
X
Y
Z
Table 16. Self-Test Output in LSB for ±4 g, 10-Bit Resolution
(T
Axis
X
Y
Z
Table 17. Self-Test Output in LSB for ±8 g, 10-Bit Resolution
(T
Axis
X
Y
Z
Table 18. Self-Test Output in LSB for ±16 g, 10-Bit Resolution
(T
Axis
X
Y
Z
A
A
A
= 25°C, V
= 25°C, V
= 25°C, V
S
S
S
S
A
= 2.5 V, V
= 2.5 V, V
= 2.5 V, V
= 25°C, V
Min
50
−540
75
Min
25
−270
38
Min
12
−135
19
Min
6
−67
10
S
(V)
DD I/O
DD I/O
DD I/O
S
= 2.5 V, V
= 1.8 V)
= 1.8 V)
= 1.8 V)
X-Axis, Y-Axis
0.64
1.00
1.77
2.11
Max
540
−50
875
Max
270
−25
438
Max
135
−12
219
Max
67
−6
110
DD I/O
= 1.8 V)
Data Sheet
Unit
LSB
LSB
LSB
Unit
LSB
LSB
LSB
Unit
LSB
LSB
LSB
Z-Axis
0.8
1.00
1.47
1.69
Unit
LSB
LSB
LSB