AMD-762JLC AMD [Advanced Micro Devices], AMD-762JLC Datasheet - Page 48
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AMD-762JLC
Manufacturer Part Number
AMD-762JLC
Description
System Controller
Manufacturer
AMD [Advanced Micro Devices]
Datasheet
1.AMD-762JLC.pdf
(122 pages)
- Current page: 48 of 122
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AMD-762™ System Controller Data Sheet
3.1.1
3.2
36
NAND Tree Test Mode
Board Test Mode Clocking
to some I/O cells that cannot be asynchronously forced into a
three-state mode.
Board test mode is entered when the AD[25] pin is asserted
High simultaneous with the TEST# pin during RESET#
assertion. The test mode is then latched coming out of reset.
The AD[09] pin should also be pulled up to force the internal
PLLs to be bypassed.
Three-state mode can be exited by an assertion of the RESET#
pin. This reset also disables the PLL bypass mode if it was
entered.
When entering three-state mode, the PLLs should also be
bypassed as described above. This procedure forces the clocks
driven on the SYSCLK and AGPCLK input pins to be routed
directly to the appropriate clock domains. The SYSCLK and
AGPCLK pins must then be clocked for six clocks as required to
force some AMD-762 system controller I/O pads to the three-
state mode.
NAND tree testing is used on the tester and can also be used
during board testing to test connectivity of AMD-762 system
controller inputs. In this test mode, each AMD-762 system
controller input can be asserted one pin at a time, and for each
pin assertion there should be a change in state on the output of
the respective NAND tree. The AMD-762 system controller
p r ov i d e s m u l t i p l e NA N D t re e s , w h i c h s p e e d s u p
characterization of the device, and also reduces motherboard
test time. The AMD-762 system controller NAND trees are
divided by I/O type, which create the following trees:
n AMD Athlon system bus NAND tree
This tree includes all signals on the AMD Athlon processor
system bus. SYSCLK is not included in the NAND tree. The
output of this tree is the GNT[0]# pin. The ordering for this
NAND tree is shown in Table 2 on page 38.
Preliminary Information
Test
24416C—December 2001
Chapter 3
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