LA-ISPMACH4000V LATTICE [Lattice Semiconductor], LA-ISPMACH4000V Datasheet - Page 26

• Manufacturer Part Number: LA-ISPMACH4000V
• Description: 3.3V/1.8V In-System Programmable SuperFAST High Density PLDs
• Manufacturer: LATTICE [Lattice Semiconductor]

Lattice Semiconductor
Switching Test Conditions
Figure 12 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 9.
Figure 12. Output Test Load, LVTTL and LVCMOS Standards
Table 9. Test Fixture Required Components
LVCMOS I/O, (L -> H, H -> L)
LVCMOS I/O (Z -> H)
LVCMOS I/O (Z -> L)
LVCMOS I/O (H -> Z)
LVCMOS I/O (L -> Z)
1. C
L
includes test fixtures and probe capacitance.
Test Condition
DUT
106Ω 106Ω
106Ω
106Ω
R
∞
∞
1
LA-ispMACH 4000V/Z Automotive Family Data Sheet
106Ω
106Ω
R
∞
∞
2
V
R 1
R 2
26
CCO
35pF
35pF
35pF
5pF
5pF
C
L
1
C L
LVCMOS 3.3 = 1.5V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
1.5V
1.5V
V
V
OH
OL
+ 0.3
- 0.3
0213A/ispm4k
Timing Ref.
Point
Test
CCO
CCO
/2
/2
LVCMOS 3.3 = 3.0V
LVCMOS 2.5 = 2.3V
LVCMOS 1.8 = 1.65V
3.0V
3.0V
3.0V
3.0V
V
CCO