IDT7164 IDT [Integrated Device Technology], IDT7164 Datasheet - Page 4

• Manufacturer Part Number: IDT7164
• Description: CMOS STATIC RAM 64K (8K x 8-BIT)
• Manufacturer: IDT [Integrated Device Technology]

IDT7164S/L
CMOS STATIC RAM 64K (8K x 8-BIT)
DC ELECTRICAL CHARACTERISTICS
(V
DATA RETENTION CHARACTERISTICS OVER ALL TEMPERATURE RANGES
(L Version Only) (V
NOTES:
1. T
2. t
3. This parameter is guaranteed by device characterization, but is not production tested.
AC TEST CONDITIONS
Symbol
|I
|I
V
V
Symbol
V
I
t
t
|I
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
AC Test Load
CC
LI
LO
CCDR
CDR
R
OL
OH
LI
RC
DR
|
(3)
A
|
|
(3)
= +25 C.
= 5.0V
= Read Cycle Time.
(3)
DATA
Input Leakage Current
Output Leakage Current
Output Low Voltage
Output High Voltage
V
Data Retention Current
Chip Deselect to Data
Retention Time
Operation Recovery Time
Input Leakage Current
10%)
CC
OUT
for Data Retention
Parameter
Figure 1. AC Test Load
LC
255
Parameter
= 0.2V, V
HC
= V
5V
V
V
V
V
I
I
I
OL
OL
OH
CC
IN
CC
OUT
See Figures 1 and 2
CC
480
= 8mA, V
= 10mA, V
= GND to V
= –4mA, V
30pF*
= Max.,
= Max.,
GND to 3.0V
= GND to V
- 0.2V)
1.
2. CS
Test Condition
2967 drw 03
CS
CS
1.5V
1.5V
Test Condition
5ns
*Includes scope and jig capacitances
1
2
2
CS
CC
CC
CC
V
V
V
—
CC
1
= Min.
HC
HC
LC
= V
CC
= Min.
= Min.
2967 tbl 10
, or
MIL.
COM’L.
IH,
6.1
MIL.
COM’L.
MIL.
COM’L.
t
Min.
RC
2.0
—
—
—
0
(2)
(for t
CLZ1,
DATA
MILITARY AND COMMERCIAL TEMPERATURE RANGES
Min.
2.4
2.0v
—
—
—
—
—
10
10
—
—
—
—
t
IDT7164S
CLZ2
OUT
Typ.
V
, t
Figure 2. AC Test Load
CC
255
OLZ
Max.
@
(1)
0.4
0.5
10
10
—
, t
3.0V
5
5
—
15
15
—
—
—
CHZ1,
t
CHZ2
Min.
2.0V
2.4
—
—
—
—
—
200
—
, t
60
5V
—
—
—
IDT7164L
2
OHZ
480
V
5pF*
Max.
, t
CC
OW
2967 drw 04
@
Max.
, and t
0.4
0.5
3.0V
—
300
5
2
5
2
90
—
—
—
2
WHZ
2967 tbl 08
2967 tbl 09
Unit
Unit
)
ns
ns
V
V
V
4
A
A
A
A