zl50015qcg1 Zarlink Semiconductor, zl50015qcg1 Datasheet - Page 11
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zl50015qcg1
Manufacturer Part Number
zl50015qcg1
Description
Enhanced 1 K Channel Tdm Switch With Rate Conversion
Manufacturer
Zarlink Semiconductor
Datasheet
1.ZL50015QCG1.pdf
(81 pages)
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Part Number:
ZL50015QCG1
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PBGA Pin
B12, B13,
C10, C11,
K12, C12,
B14, C13
G3, D12,
F13, G4,
Number
M3
G5
K3
L4
L3
LQFP Pin
150, 151,
152, 153,
144, 107,
210, 149
148, 208
Number
80, 105,
234
238
239
240
212
Pin Name
IC_Open
IC_GND
TRST
TMS
TCK
TDo
TDi
Zarlink Semiconductor Inc.
Test Mode Select (5 V-Tolerant Input with Internal Pull-up)
JTAG signal that controls the state transitions of the TAP
controller. This pin is pulled high by an internal pull-up resistor
when it is not driven.
Test Clock (5 V-Tolerant Schmitt-Triggered Input with Internal
Pull-up)
Test Reset (5 V-Tolerant Input with Internal Pull-up)
Asynchronously initializes the JTAG TAP controller by putting it in
the Test-Logic-Reset state. This pin should be pulsed low during
power-up to ensure that the device is in the normal functional
mode. When JTAG is not being used, this pin should be pulled low
during normal operation.
Test Serial Data In (5 V-Tolerant Input with Internal Pull-up)
JTAG serial test instructions and data are shifted in on this pin.
This pin is pulled high by an internal pull-up resistor when it is not
driven.
Test Serial Data Out (5 V-Tolerant Three-state Output)
JTAG serial data is output on this pin on the falling edge of TCK.
This pin is held in high impedance state when JTAG is not
enabled.
Internal Test Mode (5 V-Tolerant Input with Internal
Pull-down)
These pins may be left unconnected.
Internal Test Mode Enable (5 V-Tolerant Input)
These pins MUST be low.
Provides the clock to the JTAG test logic.
ZL50016
11
Description
Data Sheet
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