mc9s08qg8 Freescale Semiconductor, Inc, mc9s08qg8 Datasheet - Page 279
mc9s08qg8
Manufacturer Part Number
mc9s08qg8
Description
Hcs08 Microcontrollers
Manufacturer
Freescale Semiconductor, Inc
Datasheet
1.MC9S08QG8.pdf
(300 pages)
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1
The susceptibility performance classification is described in
Freescale Semiconductor
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
Data based on qualification test results. Not tested in production.
Result
A
B
C
D
E
Parameter
Self-recovering
Hard failure
Soft failure
No failure
Damage
failure
Table A-17. Susceptibility Performance Classification
MC9S08QG8 and MC9S08QG4 Data Sheet, Rev. 1.01
Table A-16. Conducted Susceptibility, EFT/B
The MCU performs as designed during and after exposure.
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
V
Symbol
CS_EFT
package type
Conditions
V
T
A
DD
= +25
TBD
= 3.3V
Performance Criteria
o
C
Table
TBD crystal
f
TBD bus
OSC
/f
A-17.
BUS
Result
Appendix A Electrical Characteristics
A
B
C
D
Amplitude
(Min)
TBD
TBD
TBD
TBD
1
Unit
kV
279