lx64eb Lattice Semiconductor Corp., lx64eb Datasheet - Page 49

• Manufacturer Part Number: lx64eb
• Description: High Performance Interfacing And Switching
• Manufacturer: Lattice Semiconductor Corp.

Lattice Semiconductor
Switching Test Conditions
Figure 23 shows the output test load used for AC testing. Specific values for resistance, capacitance, voltage and
other test conditions are shown in Table 7.
Figure 23. Output Test Load, LVTTL and LVCMOS Standards (1.8V)
Table 7. Test Fixture Required Components
Default LVCMOS 1.8 I/O (L -> H, H -> L)
LVCMOS I/O (L -> H, H -> L)
Default LVCMOS 1.8 I/O (Z -> H)
Default LVCMOS 1.8 I/O (Z -> L)
Default LVCMOS 1.8 I/O (H -> Z)
Default LVCMOS 1.8 I/O (L -> Z)
Note: Output test conditions for all other interfaces are determined by the respective standards.
Test Condition
*C
Device
Output
L
includes Test Fixture and Probe Capacitance.
106
106
106
R
—
—
—
1
V
106
106
106
R
—
—
—
CCO
2
49
R
R
1
2
35pF
35pF
35pF
35pF
5pF
5pF
C
L
C
L
LVCMOS2.5 = V
LVCMOS1.8 = V
*
LVCMOS3.3 = 1.5V
Timing Ref.
V
V
OH
OL
V
V
V
CCO
CCO
CCO
ispGDX2 Family Data Sheet
+ 0.15
- 0.15
Point
Test
/2
/2
/2
CCO
CCO
/2
/2
LVCMOS1.8 = 1.65V
LVCMOS3.3 = 3.0V
LVCMOS2.5 = 2.3V
1.65V
1.65V
1.65V
1.65V
V
1.8V
CCO