isd-t360sb ETC-unknow, isd-t360sb Datasheet - Page 98

• Manufacturer Part Number: isd-t360sb
• Manufacturer: ETC-unknow

ISD-T360SB
2-62
62
63
65
66
67
Index
Index
Memory Device Size:
NUM_OF_BLOCKS_IN_ME
M
Memory Size for Testing
NUM_OF_BLOCKS_FOR_TE
ST
Channel 0 Delay:
CFRD0
Channel 1 Delay:
CFRD1
Channel 2 Delay:
CFRD2
Parameter Name
Parameter Name
Table 2-11: TUNABLE PARAMETERS: Codec Support (Samples)
Table 2-10: TUNABLE PARAMETERS: Memory Support
Defines the number of blocks (each block is of 4096 bytes) in every
Flash memory device. The number and type of connected
devices are defined by the CFG command.
Note: this parameter must be tuned before the CFG command.
Defines the number of blocks (each block is of 4096 bytes) in every
Flash memory device for production line testing purposes.
The number should be small to minimize testing time during the
production sequence. However, the number of blocks should be
larger than the number of expected bad blocks in the memory
device.
In case of value=0, no production test is performed.
In any case other than value= 0, the number of blocks is defined
by the parameter value, and a production testing cycle is
performed after RESET.
Legal values: 0 to the value of tune 62.
Note: If power fails during production testing cycle, the
memory status is unpredicted. The memory device should be
replaced and the production test should be repeated.
Note: this parameter must be tuned before the INIT command.
The delay of codec channel 0 from Frame Synch 0 (CFS0) to
start of valid data.
Legal values: 0 to 255
The delay of codec channel 1 from Frame Synch 0 (CFS0) to
start of valid data.
Legal values: 0 to 255
The delay of codec channel 2 from Frame Synch 0 (CFS0) to
start of valid data.
Legal values: 0 to 255
Flash Device Size (Mbits)
4
8
16
Description
Description
128
256
512
Number of Blocks Value
Voice Solutions in Silicon™
2—SOFTWARE
128
0
1
9
17
Default
Default