NC7SZ74L8X Fairchild Semiconductor, NC7SZ74L8X Datasheet - Page 2

IC FLIP FLOP UHS D 8-MICROPAK

NC7SZ74L8X

Manufacturer Part Number
NC7SZ74L8X
Description
IC FLIP FLOP UHS D 8-MICROPAK
Manufacturer
Fairchild Semiconductor
Series
7SZr
Type
D-Typer
Datasheet

Specifications of NC7SZ74L8X

Function
Set(Preset) and Reset
Output Type
Differential
Number Of Elements
1
Number Of Bits Per Element
1
Frequency - Clock
75MHz
Delay Time - Propagation
6.5ns
Trigger Type
Positive Edge
Current - Output High, Low
32mA, 32mA
Voltage - Supply
1.65 V ~ 5.5 V
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
8-MicroPak™
Number Of Circuits
1
Logic Family
7S
Logic Type
D-Type Flip-Flop
Polarity
Inverting/Non-Inverting
Input Type
Single-Ended
Propagation Delay Time
7 ns
High Level Output Current
- 32 mA
Low Level Output Current
32 mA
Supply Voltage (max)
5.5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
Supply Voltage (min)
1.65 V
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
NC7SZ74L8X
Manufacturer:
TOREX
Quantity:
12 000
Part Number:
NC7SZ74L8X
Manufacturer:
FAIRCHILD/仙童
Quantity:
20 000
Company:
Part Number:
NC7SZ74L8X
Quantity:
5 000
Company:
Part Number:
NC7SZ74L8X
Quantity:
4 304
package assembled at Hana-Ayutthaya.
Change From
Change To
Results/Discussion for Qual Plan Number - Q20070331
Test: (Autoclave) | Conditions: 100%RH, 121C | Standard: JESD22-A102
Lot
Q20070331AAACLVB
Q20070331BAACLVB
Q20070331CAACLVB
Q20070331DAACLVB
Test: (C Scanning Acoustical Microscope) | Conditions: | Standard:
Lot
Q20070331AACSAM1B
Q20070331AACSAM2B
Q20070331BACSAM1B
Q20070331BACSAM2B
Q20070331CACSAM1B
Q20070331CACSAM2B
Q20070331DACSAM1B
Q20070331DACSAM2B
Test: (Construction Analysis) | Conditions: | Standard:
Lot
Q20070331AACONSTB
Q20070331BACONSTB
Q20070331CACONSTB
Q20070331DACONSTB
Test: (Flammability Certificate (3)) | Conditions: | Standard: UL94-0
Lot
Q20070331AAFLAMB
Q20070331BAFLAMB
Q20070331CAFLAMB
Q20070331DAFLAMB
Test: (High Temperature Storage Life) | Conditions: 150C | Standard: JESD22-A103
Lot
Q20070331AAHTSLB
Q20070331BAHTSLB
Q20070331CAHTSLB
Q20070331DAHTSLB
Test: (Highly Accelerated Stress Test) | Conditions: 85%RH, 110C, 0V | Standard: JESD22-A110
Lot
Q20070331AAHAST2B
Device
FSA2257L10X
NC7SZ125L6X
FHP3131IL6X
NC7SZ74L8X
Device
FSA2257L10X
NC7SZ125L6X
FHP3131IL6X
NC7SZ74L8X
Device
FSA2257L10X
NC7SZ125L6X
FHP3131IL6X
NC7SZ74L8X
Device
FSA2257L10X
NC7SZ125L6X
FHP3131IL6X
NC7SZ74L8X
Device
FSA2257L10X
NC7SZ125L6X
FHP3131IL6X
NC7SZ74L8X
Device
FSA2257L10X
Setpoint
96-HOURS
96-HOURS
96-HOURS
96-HOURS
Setpoint
Setpoint
Setpoint
Setpoint
168-HOURS
1000-HOURS
168-HOURS
1000-HOURS
168-HOURS
1000-HOURS
168-HOURS
1000-HOURS
Setpoint
264-HOURS
Result
0/77
0/77
0/77
0/77
Result
0/10
0/10
0/10
0/10
0/10
0/10
0/10
0/10
Result
0/10
0/10
0/10
0/10
Result
0/1
0/1
0/1
0/1
Result
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
Result
0/45
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Failure Code
Pg. 2

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